Thermal damage at short electron bunches passage through a thin target; Journal of Physics: Conference Series; Vol. 732 : Radiation from Relativistic Electrons in Periodic Structures (RREPS2015)

Detaylı Bibliyografya
Parent link:Journal of Physics: Conference Series
Vol. 732 : Radiation from Relativistic Electrons in Periodic Structures (RREPS2015).— 2016.— [012030, 7 p.]
Yazar: Babaev A. A. Anton Anatoljevich
Müşterek Yazar: Национальный исследовательский Томский политехнический университет (ТПУ) Физико-технический институт (ФТИ) Кафедра прикладной физики (№ 12) (ПФ) Международная научно-образовательная лаборатория "Рентгеновская оптика" (МНОЛ РО)
Diğer Yazarlar: Gogolev A. S. Aleksey Sergeevich
Özet:Title screen
The thin target could be used for beam diagnostics by means the radiation that is induced by interaction of beam particles with target matter. The electron beams used in modern applications (as, for example, modern FELs) have very large brightness, small emittance as well as very short bunch length. For example, the bunch length of XFEL is about of 25 um at bunch charge order of 1 nC and with electrons energy of 17.5 GeV. The passage of this powerful short bunches could damage the target or even completely destroy it. In the presented work the train of such bunches passages through the target is investigated. It is shown the target works in extreme regime close to phase transition temperature.
Dil:İngilizce
Baskı/Yayın Bilgisi: 2016
Seri Bilgileri:Monochromatic X- and Gamma Beams Produced at Electron Accelerators
Konular:
Online Erişim:http://dx.doi.org/10.1088/1742-6596/732/1/012030
http://earchive.tpu.ru/handle/11683/33961
Materyal Türü: Elektronik Kitap Bölümü
KOHA link:https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=650753

MARC

LEADER 00000nla2a2200000 4500
001 650753
005 20250522160909.0
035 |a (RuTPU)RU\TPU\network\16002 
035 |a RU\TPU\network\16001 
090 |a 650753 
100 |a 20161018a2016 k y0engy50 ba 
101 0 |a eng 
105 |a y z 100zy 
135 |a drcn ---uucaa 
181 0 |a i  
182 0 |a b 
200 1 |a Thermal damage at short electron bunches passage through a thin target  |f A. A. Babaev, A. S. Gogolev 
203 |a Text  |c electronic 
225 1 |a Monochromatic X- and Gamma Beams Produced at Electron Accelerators 
300 |a Title screen 
320 |a [References: 8 tit.] 
330 |a The thin target could be used for beam diagnostics by means the radiation that is induced by interaction of beam particles with target matter. The electron beams used in modern applications (as, for example, modern FELs) have very large brightness, small emittance as well as very short bunch length. For example, the bunch length of XFEL is about of 25 um at bunch charge order of 1 nC and with electrons energy of 17.5 GeV. The passage of this powerful short bunches could damage the target or even completely destroy it. In the presented work the train of such bunches passages through the target is investigated. It is shown the target works in extreme regime close to phase transition temperature. 
461 0 |0 (RuTPU)RU\TPU\network\3526  |t Journal of Physics: Conference Series 
463 0 |0 (RuTPU)RU\TPU\network\15969  |t Vol. 732 : Radiation from Relativistic Electrons in Periodic Structures (RREPS2015)  |o XI International Symposium, 6–11 September 2015, Saint Petersburg, Russian Federation  |o [proceedings]  |f National Research Tomsk Polytechnic University (TPU)  |v [012030, 7 p.]  |d 2016 
610 1 |a электронный ресурс 
610 1 |a труды учёных ТПУ 
610 1 |a тепловые повреждения 
610 1 |a электронные сгустки 
610 1 |a мишени 
610 1 |a электронные лучи 
700 1 |a Babaev  |b A. A.  |c physicist  |c engineer-issledovatelskogo Polytechnic University, candidate of physical and mathematical Sciences  |f 1981-  |g Anton Anatoljevich  |3 (RuTPU)RU\TPU\pers\35154  |9 18420 
701 1 |a Gogolev  |b A. S.  |c physicist  |c associate professor of Tomsk Polytechnic University, Candidate of physical and mathematical sciences  |f 1983-  |g Aleksey Sergeevich  |3 (RuTPU)RU\TPU\pers\31537  |9 15698 
712 0 2 |a Национальный исследовательский Томский политехнический университет (ТПУ)  |b Физико-технический институт (ФТИ)  |b Кафедра прикладной физики (№ 12) (ПФ)  |b Международная научно-образовательная лаборатория "Рентгеновская оптика" (МНОЛ РО)  |3 (RuTPU)RU\TPU\col\19530 
801 2 |a RU  |b 63413507  |c 20170120  |g RCR 
850 |a 63413507 
856 4 |u http://dx.doi.org/10.1088/1742-6596/732/1/012030 
856 4 |u http://earchive.tpu.ru/handle/11683/33961 
942 |c CF