Thermal damage at short electron bunches passage through a thin target; Journal of Physics: Conference Series; Vol. 732 : Radiation from Relativistic Electrons in Periodic Structures (RREPS2015)

Bibliografiske detaljer
Parent link:Journal of Physics: Conference Series
Vol. 732 : Radiation from Relativistic Electrons in Periodic Structures (RREPS2015).— 2016.— [012030, 7 p.]
Hovedforfatter: Babaev A. A. Anton Anatoljevich
Institution som forfatter: Национальный исследовательский Томский политехнический университет (ТПУ) Физико-технический институт (ФТИ) Кафедра прикладной физики (№ 12) (ПФ) Международная научно-образовательная лаборатория "Рентгеновская оптика" (МНОЛ РО)
Andre forfattere: Gogolev A. S. Aleksey Sergeevich
Summary:Title screen
The thin target could be used for beam diagnostics by means the radiation that is induced by interaction of beam particles with target matter. The electron beams used in modern applications (as, for example, modern FELs) have very large brightness, small emittance as well as very short bunch length. For example, the bunch length of XFEL is about of 25 um at bunch charge order of 1 nC and with electrons energy of 17.5 GeV. The passage of this powerful short bunches could damage the target or even completely destroy it. In the presented work the train of such bunches passages through the target is investigated. It is shown the target works in extreme regime close to phase transition temperature.
Sprog:engelsk
Udgivet: 2016
Serier:Monochromatic X- and Gamma Beams Produced at Electron Accelerators
Fag:
Online adgang:http://dx.doi.org/10.1088/1742-6596/732/1/012030
http://earchive.tpu.ru/handle/11683/33961
Format: Electronisk Book Chapter
KOHA link:https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=650753
Beskrivelse
Summary:Title screen
The thin target could be used for beam diagnostics by means the radiation that is induced by interaction of beam particles with target matter. The electron beams used in modern applications (as, for example, modern FELs) have very large brightness, small emittance as well as very short bunch length. For example, the bunch length of XFEL is about of 25 um at bunch charge order of 1 nC and with electrons energy of 17.5 GeV. The passage of this powerful short bunches could damage the target or even completely destroy it. In the presented work the train of such bunches passages through the target is investigated. It is shown the target works in extreme regime close to phase transition temperature.
DOI:10.1088/1742-6596/732/1/012030