Electron beam diagnostics tool based on Cherenkov radiation in optical fibers; Journal of Physics: Conference Series; Vol. 732 : Radiation from Relativistic Electrons in Periodic Structures (RREPS2015)

Dettagli Bibliografici
Parent link:Journal of Physics: Conference Series
Vol. 732 : Radiation from Relativistic Electrons in Periodic Structures (RREPS2015).— 2016.— [012011, 7 p.]
Enti autori: Национальный исследовательский Томский политехнический университет (ТПУ) Физико-технический институт (ФТИ) Кафедра прикладной физики (№ 12) (ПФ) Международная научно-образовательная лаборатория "Рентгеновская оптика" (МНОЛ РО), Национальный исследовательский Томский политехнический университет (ТПУ) Физико-технический институт (ФТИ) Кафедра прикладной физики (№ 12) (ПФ)
Altri autori: Vukolov A. V. Artem Vladimirovich, Novokshonov A. I. Artem Igorevich, Potylitsyn A. P. Alexander Petrovich, Uglov S. R. Sergey Romanovich
Riassunto:Title screen
The results of experimental investigations of Cherenkov radiation in optical fibers with 0.6 mm thickness which were used to scan an electron beam of 5.7 MeV energy are presented. Using such a technique for beam profile measurements it is possible to create a compact and reliable device compared to existing systems based on ionization chambers.
Lingua:inglese
Pubblicazione: 2016
Serie:General Aspects of Physical Phenomena and Processes Associated with Electromagnetic Radiation
Soggetti:
Accesso online:http://dx.doi.org/10.1088/1742-6596/732/1/012011
http://earchive.tpu.ru/handle/11683/33955
Natura: MixedMaterials Elettronico Capitolo di libro
KOHA link:https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=650744