In-service change in radiant power of infrared LEDs; Control and Communications (SIBCON)

Bibliografski detalji
Parent link:Control and Communications (SIBCON).— 2016.— [5 p.]
Glavni autor: Gradoboev A. V. Aleksandr Vasilyevich
Autori kompanije: Национальный исследовательский Томский политехнический университет (ТПУ) Юргинский технологический институт (филиал) (ЮТИ) Кафедра сварочного производства (КСП), Национальный исследовательский Томский политехнический университет (ТПУ) Юргинский технологический институт (филиал) (ЮТИ) Кафедра безопасности жизнедеятельности, экологии и физического воспитания (БЖДЭФВ)
Daljnji autori: Simonova A. V. Anastasiya Vladimirovna, Orlova K. N. Kseniya Nikolaevna
Sažetak:Title screen
At present infrared light emitting diodes are used in diverse scanning and optical security systems of nuclear and power plants. The purpose of work is research reducing radiant power during step-by-step accelerated test at higher ambient temperature. The objects of research are infrared light emitting diodes based on dual AlGaAs heterostructures. Two-stage reduction of radiant power has been revealed: first, it is decreased since the original defect structure is rearranged during the operating time; second, new structural defects appear during the further operating time. Moreover, devices are divided into three characteristic groups in view of the second stage, which probably have the same defect with three quasi-stationary states. We assume origination of this defect is caused by production technology of light emitting diodes.
Режим доступа: по договору с организацией-держателем ресурса
Jezik:engleski
Izdano: 2016
Teme:
Online pristup:http://dx.doi.org/10.1109/SIBCON.2016.7491662
Format: Elektronički Poglavlje knjige
KOHA link:https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=650711

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330 |a At present infrared light emitting diodes are used in diverse scanning and optical security systems of nuclear and power plants. The purpose of work is research reducing radiant power during step-by-step accelerated test at higher ambient temperature. The objects of research are infrared light emitting diodes based on dual AlGaAs heterostructures. Two-stage reduction of radiant power has been revealed: first, it is decreased since the original defect structure is rearranged during the operating time; second, new structural defects appear during the further operating time. Moreover, devices are divided into three characteristic groups in view of the second stage, which probably have the same defect with three quasi-stationary states. We assume origination of this defect is caused by production technology of light emitting diodes. 
333 |a Режим доступа: по договору с организацией-держателем ресурса 
463 |t Control and Communications (SIBCON)  |o Proceedings of the XII International Siberian Conference, Moscow, May 12-14, 2016  |v [5 p.]  |d 2016 
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700 1 |a Gradoboev  |b A. V.  |c physicist  |c Professor of Yurga technological Institute of Tomsk Polytechnic University, Doctor of technical sciences  |f 1952-  |g Aleksandr Vasilyevich  |3 (RuTPU)RU\TPU\pers\34242  |9 17773 
701 1 |a Simonova  |b A. V.  |g Anastasiya Vladimirovna 
701 1 |a Orlova  |b K. N.  |c physicist  |c Associate Professor of Yurga technological Institute of Tomsk Polytechnic University, Candidate of technical sciences  |f 1985-  |g Kseniya Nikolaevna  |3 (RuTPU)RU\TPU\pers\33587  |9 17245 
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