Calibration Interval Adjustment of a Measuring Instrument in Industries During Long-term Use; IOP Conference Series: Materials Science and Engineering; Vol. 132 : Modern Technologies for Non-Destructive Testing

Detalles Bibliográficos
Parent link:IOP Conference Series: Materials Science and Engineering
Vol. 132 : Modern Technologies for Non-Destructive Testing.— 2016.— [012029, 6 p.]
Autor Principal: Natalinova N. M. Nataliya Mikhailovna
Corporate Authors: Национальный исследовательский Томский политехнический университет (ТПУ) Институт кибернетики (ИК) Кафедра компьютерных измерительных систем и метрологии (КИСМ), Национальный исследовательский Томский политехнический университет (ТПУ) Институт развития стратегического партнерства и компетенций (ИСПК) Кафедра методики преподавания иностранных языков (МПИЯ)
Outros autores: Ilina N., Francuzskaya E. O. Evgeniya Olegovna
Summary:Title screen
Calibration interval adjustment of measuring instruments is one of the urgent tasks in industries. The article represents the calibration interval calculation of the potentiometer PCB-4P according to the verifications for the 4 year period of the Metrological Department in the aviation plant. The calibration interval is shown to be increased according to the calculation of its reliability and stability of metrological characteristics.
Idioma:inglés
Publicado: 2016
Subjects:
Acceso en liña:http://dx.doi.org/10.1088/1757-899X/132/1/012029
http://earchive.tpu.ru/handle/11683/33945
Formato: Electrónico Capítulo de libro
KOHA link:https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=650567
Descripción
Summary:Title screen
Calibration interval adjustment of measuring instruments is one of the urgent tasks in industries. The article represents the calibration interval calculation of the potentiometer PCB-4P according to the verifications for the 4 year period of the Metrological Department in the aviation plant. The calibration interval is shown to be increased according to the calculation of its reliability and stability of metrological characteristics.
DOI:10.1088/1757-899X/132/1/012029