Experimental Research of High-Energy Capabilities of Material Recognition by Dual-Energy Method for the Low- Dose Radiation

Bibliographic Details
Parent link:IOP Conference Series: Materials Science and Engineering
Vol. 132 : Modern Technologies for Non-Destructive Testing.— 2016.— [012012, 5 p.]
Corporate Authors: Национальный исследовательский Томский политехнический университет (ТПУ) Институт неразрушающего контроля (ИНК) Российско-китайская научная лаборатория радиационного контроля и досмотра (РКНЛ РКД), Национальный исследовательский Томский политехнический университет (ТПУ) Институт неразрушающего контроля (ИНК) Лаборатория № 43 (Разработки малогабаритных бетатронов)
Other Authors: Abashkin A., Osipov S. P. Sergey Pavlovich, Chakhlov S. V. Sergey Vladimirovich, Stein A. M. Aleksandr Mikhailovich
Summary:Title screen
The algorithm to produce primary radiographs, its transformation by dual energy method and recognition of the object materials were enhanced based on the analysis of experimental results. The experiments were carried out at the inspection complex with high X- ray source - betatron MIB 4/9 in Tomsk Polytechnic University. For the reduced X -ray dose rate, the possibility of recognition of the object materials with thickness from 20 to 120 g/cm{2} was proved under the condition that as the dose rate is reduced by the defined number of times, the segment of the image fragment with the reliably identified material will increase by the same number of times.
Language:English
Published: 2016
Subjects:
Online Access:http://dx.doi.org/10.1088/1757-899X/132/1/012012
http://earchive.tpu.ru/handle/11683/33953
Format: Electronic Book Chapter
KOHA link:https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=650546
Description
Summary:Title screen
The algorithm to produce primary radiographs, its transformation by dual energy method and recognition of the object materials were enhanced based on the analysis of experimental results. The experiments were carried out at the inspection complex with high X- ray source - betatron MIB 4/9 in Tomsk Polytechnic University. For the reduced X -ray dose rate, the possibility of recognition of the object materials with thickness from 20 to 120 g/cm{2} was proved under the condition that as the dose rate is reduced by the defined number of times, the segment of the image fragment with the reliably identified material will increase by the same number of times.
DOI:10.1088/1757-899X/132/1/012012