Enhancement Effects of Transition and Vavilov-Cherenkov Radiation Mechanisms Under Grazing Interaction of Fast Electrons With a Thick Substrate Applied by Thin Layer

מידע ביבליוגרפי
Parent link:IOP Conference Series: Materials Science and Engineering
Vol. 142 : Innovative Technologies in Engineering.— 2016.— [012038, 6 p.]
מחבר תאגידי: Национальный исследовательский Томский политехнический университет (ТПУ) Физико-технический институт (ФТИ) Кафедра прикладной физики (№ 12) (ПФ)
מחברים אחרים: Irribarra E., Kubankin A. S. Aleksandr Sergeevich, Sotnikov A., Nazhmudinov R. M., Fam T., Starovoytov A. P.
סיכום:Title screen
The paper presents the results of a theoretical study and a mathematical model of radiation processes occurred during the grazing interaction of fast electrons with semi-infinite targets applied on a thin amorphous layer. The developed model considers Vavilov-Cherenkov and transition radiation mechanisms and predicts the possibility to enhance the angular radiation density under grazing incidence of fast electrons on the layer. The characteristics of possible extreme vacuum ultraviolet and soft X-ray sources are estimated.
שפה:אנגלית
יצא לאור: 2016
נושאים:
גישה מקוונת:http://dx.doi.org/10.1088/1757-899X/142/1/012038
http://earchive.tpu.ru/handle/11683/34721
פורמט: אלקטרוני Book Chapter
KOHA link:https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=650399

MARC

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200 1 |a Enhancement Effects of Transition and Vavilov-Cherenkov Radiation Mechanisms Under Grazing Interaction of Fast Electrons With a Thick Substrate Applied by Thin Layer  |f E. Irribarra [et al.] 
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330 |a The paper presents the results of a theoretical study and a mathematical model of radiation processes occurred during the grazing interaction of fast electrons with semi-infinite targets applied on a thin amorphous layer. The developed model considers Vavilov-Cherenkov and transition radiation mechanisms and predicts the possibility to enhance the angular radiation density under grazing incidence of fast electrons on the layer. The characteristics of possible extreme vacuum ultraviolet and soft X-ray sources are estimated. 
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