Enhancement Effects of Transition and Vavilov-Cherenkov Radiation Mechanisms Under Grazing Interaction of Fast Electrons With a Thick Substrate Applied by Thin Layer; IOP Conference Series: Materials Science and Engineering; Vol. 142 : Innovative Technologies in Engineering

Detalles Bibliográficos
Parent link:IOP Conference Series: Materials Science and Engineering
Vol. 142 : Innovative Technologies in Engineering.— 2016.— [012038, 6 p.]
Autor Corporativo: Национальный исследовательский Томский политехнический университет (ТПУ) Физико-технический институт (ФТИ) Кафедра прикладной физики (№ 12) (ПФ)
Otros Autores: Irribarra E., Kubankin A. S. Aleksandr Sergeevich, Sotnikov A., Nazhmudinov R. M., Fam T., Starovoytov A. P.
Sumario:Title screen
The paper presents the results of a theoretical study and a mathematical model of radiation processes occurred during the grazing interaction of fast electrons with semi-infinite targets applied on a thin amorphous layer. The developed model considers Vavilov-Cherenkov and transition radiation mechanisms and predicts the possibility to enhance the angular radiation density under grazing incidence of fast electrons on the layer. The characteristics of possible extreme vacuum ultraviolet and soft X-ray sources are estimated.
Lenguaje:inglés
Publicado: 2016
Materias:
Acceso en línea:http://dx.doi.org/10.1088/1757-899X/142/1/012038
http://earchive.tpu.ru/handle/11683/34721
Formato: Electrónico Capítulo de libro
KOHA link:https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=650399
Descripción
Sumario:Title screen
The paper presents the results of a theoretical study and a mathematical model of radiation processes occurred during the grazing interaction of fast electrons with semi-infinite targets applied on a thin amorphous layer. The developed model considers Vavilov-Cherenkov and transition radiation mechanisms and predicts the possibility to enhance the angular radiation density under grazing incidence of fast electrons on the layer. The characteristics of possible extreme vacuum ultraviolet and soft X-ray sources are estimated.
DOI:10.1088/1757-899X/142/1/012038