Hard X–ray Laue monochromator

Hard X–ray Laue monochromator

Détails bibliographiques
Parent link:	IOP Conference Series: Materials Science and Engineering Vol. 135 : Issues of Physics and Technology in Science, Industry and Medicine.— 2016.— [012018, 5 p.]
Collectivités auteurs:	Национальный исследовательский Томский политехнический университет (ТПУ) Физико-технический институт (ФТИ) Кафедра прикладной физики (№ 12) (ПФ), Национальный исследовательский Томский политехнический университет (ТПУ) Институт неразрушающего контроля (ИНК) Российско-китайская научная лаборатория радиационного контроля и досмотра (РКНЛ РКД)
Autres auteurs:	Kocharian (Kocharyan) V. R. Vagan Rashidovich, Gogolev A. S. Aleksey Sergeevich, Kiziridi A. A. Aydana Abayevna, Batranin A. V. Andrey Viktorovich, Muradyan T. R.
Résumé:	Title screen Experimental studies of X-ray diffraction from reflecting atomic planes (1011) of X-cut quartz single crystal in Laue geometry influenced by the temperature gradient were carried out. It is shown that by using the temperature gradient it is possible to reflect a hard Xray beam with photon energy near the 100 keV with high efficiency. It has been experimentally proved that the intensity of the reflected beam can be increased by more than order depending on the value of the temperature gradient.
Publié:	2016
Sujets:	электронный ресурс труды учёных ТПУ монохроматоры дифракция рентгеновские лучи атомные плоскости монокристаллы пучки
Accès en ligne:	http://dx.doi.org/10.1088/1757-899X/135/1/012018 http://earchive.tpu.ru/handle/11683/34806
Format:	Électronique Chapitre de livre
KOHA link:	https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=650273

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