Hard X–ray Laue monochromator

Chi tiết về thư mục
Parent link:IOP Conference Series: Materials Science and Engineering
Vol. 135 : Issues of Physics and Technology in Science, Industry and Medicine.— 2016.— [012018, 5 p.]
Nhiều tác giả của công ty: Национальный исследовательский Томский политехнический университет (ТПУ) Физико-технический институт (ФТИ) Кафедра прикладной физики (№ 12) (ПФ), Национальный исследовательский Томский политехнический университет (ТПУ) Институт неразрушающего контроля (ИНК) Российско-китайская научная лаборатория радиационного контроля и досмотра (РКНЛ РКД)
Tác giả khác: Kocharian (Kocharyan) V. R. Vagan Rashidovich, Gogolev A. S. Aleksey Sergeevich, Kiziridi A. A. Aydana Abayevna, Batranin A. V. Andrey Viktorovich, Muradyan T. R.
Tóm tắt:Title screen
Experimental studies of X-ray diffraction from reflecting atomic planes (1011) of X-cut quartz single crystal in Laue geometry influenced by the temperature gradient were carried out. It is shown that by using the temperature gradient it is possible to reflect a hard Xray beam with photon energy near the 100 keV with high efficiency. It has been experimentally proved that the intensity of the reflected beam can be increased by more than order depending on the value of the temperature gradient.
Được phát hành: 2016
Những chủ đề:
Truy cập trực tuyến:http://dx.doi.org/10.1088/1757-899X/135/1/012018
http://earchive.tpu.ru/handle/11683/34806
Định dạng: Điện tử Chương của sách
KOHA link:https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=650273
Miêu tả
Tóm tắt:Title screen
Experimental studies of X-ray diffraction from reflecting atomic planes (1011) of X-cut quartz single crystal in Laue geometry influenced by the temperature gradient were carried out. It is shown that by using the temperature gradient it is possible to reflect a hard Xray beam with photon energy near the 100 keV with high efficiency. It has been experimentally proved that the intensity of the reflected beam can be increased by more than order depending on the value of the temperature gradient.
DOI:10.1088/1757-899X/135/1/012018