Simulation of the Sample Alignment Process for the White Beam Tomography; IOP Conference Series: Materials Science and Engineering; Vol. 142 : Innovative Technologies in Engineering

Simulation of the Sample Alignment Process for the White Beam Tomography; IOP Conference Series: Materials Science and Engineering; Vol. 142 : Innovative Technologies in Engineering

Detalhes bibliográficos
Parent link:	IOP Conference Series: Materials Science and Engineering Vol. 142 : Innovative Technologies in Engineering.— 2016.— [012039, 8 p.]
Autor principal:	Ozdiev A. H. Ali Hosenovich
Autor Corporativo:	Национальный исследовательский Томский политехнический университет (ТПУ) Физико-технический институт (ФТИ) Кафедра общей физики (ОФ)
Outros Autores:	Liventsov S. N. Sergey Nikolaevich
Resumo:	Title screen Nowadays growth of synthetic crystals is a very prospective direction of research activity. However, it is well known that in synthesized crystals there are still many defects and the main idea is to synthesize crystal of ideal form and structure. But in purpose to remove defects first you have to characterize them. This paper describes the method for the characterization of such defects and mainly concentrates on the problem of sample alignment procedure, offering the way to avoid misalignments.
Idioma:	inglês
Publicado em:	2016
Assuntos:	электронный ресурс труды учёных ТПУ моделирование процесса томография синтетические кристаллы дефекты выравнивание
Acesso em linha:	http://dx.doi.org/10.1088/1757-899X/142/1/012039 http://earchive.tpu.ru/handle/11683/34693
Formato:	Recurso Electrónico Capítulo de Livro
KOHA link:	https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=650121

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