Lifetime of the HCEI spark gap switch for linear transformer drivers

Библиографические подробности
Источник:Pulsed Power Conference (PPC): The 20th IEEE International, May 31-June 4, 2015, Austin, Texas. [4 p.].— , 2015
Автор-организация: Национальный исследовательский Томский политехнический университет (ТПУ) Институт неразрушающего контроля (ИНК) Кафедра промышленной и медицинской электроники (ПМЭ)
Другие авторы: Kim A. A. Aleksandr Andreevich, Mazarakis M. G. Mikhail Gerasimovich, Sinebryukhov V. A. Vadim Anatoljevich, Volkov S. N. Sergey Nikolaevich, Alekseenko V. M. Vitaly Mikhaylovich, Kondratjev S. S. Sergey Sergeevich, Vasiljev S. V. Sergey Valerievich
Примечания:Title screen
Spark gap switches, storage capacitors, and ferromagnetic cores are the most important components of the Linear Transformer Driver (LTD) cavities. Depending on their output voltage and current, LTD-based accelerators may need several thousands switches, hence the switch lifetime is of crucial importance. Unlike the capacitors and the cores, the LTD switches are still in the developmental stage and are designed and built mainly by various laboratories; thus the lifetime of different switches may vary. In this paper we present recent results of the first full-scale experiments that were aimed to evaluate the life-time of the LTD switches developed by HCEI.
Режим доступа: по договору с организацией-держателем ресурса
Язык:английский
Опубликовано: 2015
Предметы:
Online-ссылка:http://dx.doi.org/10.1109/PPC.2015.7296875
Формат: Электронный ресурс Статья
Запись в KOHA:https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=649238

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