Lifetime of the HCEI spark gap switch for linear transformer drivers

ग्रंथसूची विवरण
Parent link:Pulsed Power Conference (PPC): The 20th IEEE International, May 31-June 4, 2015, Austin, Texas. [4 p.].— , 2015
निगमित लेखक: Национальный исследовательский Томский политехнический университет (ТПУ) Институт неразрушающего контроля (ИНК) Кафедра промышленной и медицинской электроники (ПМЭ)
अन्य लेखक: Kim A. A. Aleksandr Andreevich, Mazarakis M. G. Mikhail Gerasimovich, Sinebryukhov V. A. Vadim Anatoljevich, Volkov S. N. Sergey Nikolaevich, Alekseenko V. M. Vitaly Mikhaylovich, Kondratjev S. S. Sergey Sergeevich, Vasiljev S. V. Sergey Valerievich
सारांश:Title screen
Spark gap switches, storage capacitors, and ferromagnetic cores are the most important components of the Linear Transformer Driver (LTD) cavities. Depending on their output voltage and current, LTD-based accelerators may need several thousands switches, hence the switch lifetime is of crucial importance. Unlike the capacitors and the cores, the LTD switches are still in the developmental stage and are designed and built mainly by various laboratories; thus the lifetime of different switches may vary. In this paper we present recent results of the first full-scale experiments that were aimed to evaluate the life-time of the LTD switches developed by HCEI.
Режим доступа: по договору с организацией-держателем ресурса
प्रकाशित: 2015
विषय:
ऑनलाइन पहुंच:http://dx.doi.org/10.1109/PPC.2015.7296875
स्वरूप: इलेक्ट्रोनिक पुस्तक अध्याय
KOHA link:https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=649238
विवरण
सारांश:Title screen
Spark gap switches, storage capacitors, and ferromagnetic cores are the most important components of the Linear Transformer Driver (LTD) cavities. Depending on their output voltage and current, LTD-based accelerators may need several thousands switches, hence the switch lifetime is of crucial importance. Unlike the capacitors and the cores, the LTD switches are still in the developmental stage and are designed and built mainly by various laboratories; thus the lifetime of different switches may vary. In this paper we present recent results of the first full-scale experiments that were aimed to evaluate the life-time of the LTD switches developed by HCEI.
Режим доступа: по договору с организацией-держателем ресурса
डिजिटल ऑब्जेक्ट पहचानकर्ता:10.1109/PPC.2015.7296875