Analysis of Natural Diamonds by Rutherford Backscattering; Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques; Vol. 13, iss. 4
| Parent link: | Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques Vol. 13, iss. 4.— 2019 |
|---|---|
| Corporate Authors: | Национальный исследовательский Томский политехнический университет Инженерная школа ядерных технологий Научная лаборатория радиоактивных веществ и технологий, Национальный исследовательский Томский политехнический университет Инженерная школа ядерных технологий Отделение экспериментальной физики |
| Other Authors: | Sokhoreva V. V. Valentina Viktorovna, Malyutin V. M. Vasiliy Mikhailovich, Kashkarov E. B. Egor Borisovich, Kuznetsov S. I. Sergey Ivanovich |
| Summary: | Title screen The method of Rutherford backscattering (RBS) of 4He ions is used to detect impurities in the surface region of natural diamond crystals. In order to decrease the influence of luminescence from the surface of diamond, the recording of scattered ions is performed by an annular detector, which decreases the statistical error and improves the measurement accuracy. The limit of impurity detection is 1014 at/cm2 for light impurities and 1012 at/cm2 for heavy impurities. Режим доступа: по договору с организацией-держателем ресурса |
| Language: | English |
| Published: |
2019
|
| Subjects: | |
| Online Access: | https://doi.org/10.1134/S1027451019040359 |
| Format: | Electronic Book Chapter |
| KOHA link: | https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=647909 |
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