Microstructure and phase composition of a zirconium coating-silicon substrate system treated using high-current electron beams
| Parent link: | Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques.— , 2007- Vol. 7, iss. 2.— 2013.— [P. 248-253] |
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| Awduron Eraill: | , , , , , |
| Crynodeb: | Title screen The results of structuralphase conversions in a zirconium coating–silicon substrate systemtreated with lowenergy highcurrent electron beams (LHEBs) are presented. It is revealed that the action ofLHEBs with energy densities of 8–10 J/cm2 leads to the formation of a eutectic layer containing clusters witha characteristic size of 40–50 nm (the melt of ZrSi2 and silicon) at the zirconium–silicon interface. After theenergy density reaches 12 J/cm2, silicon dendrites and regions of silicide crystallites are formed in the surfacelayer 20–30 µm thick. Data on the characteristic sizes of dendrites and eutectic clusters have made it possibleto perform numerical estimation of the surfacemelt overcooling (12–25 K), the temperature gradients(3.7 Ч 107–1.6 Ч 108 K/m), and the interphase boundary velocity (0.8–3.2 Ч 10–4 m/s).DO Режим доступа: по договору с организацией-держателем ресурса |
| Iaith: | Saesneg |
| Cyhoeddwyd: |
2013
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| Pynciau: | |
| Mynediad Ar-lein: | http://dx.doi.org/10.1134/S1027451013020201 |
| Fformat: | Electronig Pennod Llyfr |
| KOHA link: | https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=647480 |
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| 200 | 1 | |a Microstructure and phase composition of a zirconium coating-silicon substrate system treated using high-current electron beams |f V. V. Uglov [et al.] | |
| 203 | |a Text |c electronic | ||
| 300 | |a Title screen | ||
| 320 | |a [References: p. 253 (30 tit.)] | ||
| 330 | |a The results of structuralphase conversions in a zirconium coating–silicon substrate systemtreated with lowenergy highcurrent electron beams (LHEBs) are presented. It is revealed that the action ofLHEBs with energy densities of 8–10 J/cm2 leads to the formation of a eutectic layer containing clusters witha characteristic size of 40–50 nm (the melt of ZrSi2 and silicon) at the zirconium–silicon interface. After theenergy density reaches 12 J/cm2, silicon dendrites and regions of silicide crystallites are formed in the surfacelayer 20–30 µm thick. Data on the characteristic sizes of dendrites and eutectic clusters have made it possibleto perform numerical estimation of the surfacemelt overcooling (12–25 K), the temperature gradients(3.7 Ч 107–1.6 Ч 108 K/m), and the interphase boundary velocity (0.8–3.2 Ч 10–4 m/s).DO | ||
| 333 | |a Режим доступа: по договору с организацией-держателем ресурса | ||
| 461 | |t Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques |d 2007- | ||
| 463 | |t Vol. 7, iss. 2 |v [P. 248-253] |d 2013 | ||
| 610 | 1 | |a электронный ресурс | |
| 610 | 1 | |a труды учёных ТПУ | |
| 701 | 1 | |a Uglov |b V. V. |c Physicist |c Leading researcher of Tomsk Polytechnic University, Doctor of physical and mathematical sciences |f 1954- |g Vladimir Vasilievich |3 (RuTPU)RU\TPU\pers\36737 |9 19776 | |
| 701 | 1 | |a Koval |b N. N. |c specialist in the field of electronics |c Professor of Tomsk Polytechnic University, Doctor of technical sciences |f 1948- |g Nikolay Nikolaevich |3 (RuTPU)RU\TPU\pers\34748 |9 18098 | |
| 701 | 1 | |a Ivanov |b Yu. F. |c physicist |c Professor of Tomsk Polytechnic University, Doctor of physical and mathematical sciences |f 1955- |g Yuriy Fedorovich |3 (RuTPU)RU\TPU\pers\33559 |9 17226 | |
| 701 | 1 | |a Petukhov |b Yu. A. | |
| 701 | 1 | |a Kalina |b A. V. | |
| 701 | 1 | |a Teresov |b A. D. | |
| 801 | 2 | |a RU |b 63413507 |c 20191212 |g RCR | |
| 856 | 4 | |u http://dx.doi.org/10.1134/S1027451013020201 | |
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