Focal Spot Size Estimation for a 4 MeV Small-size Betatron Using Digital X-ray Detector; Journal of Physics: Conference Series; Vol. 671 : Innovations in Non-Destructive Testing (SibTest 2015)

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Parent link:Journal of Physics: Conference Series
Vol. 671 : Innovations in Non-Destructive Testing (SibTest 2015).— 2016.— [012058, 6 p.]
Hlavní autor: Sukharnikov K. V. Konstantin Vladimirovich
Korporativní autor: Национальный исследовательский Томский политехнический университет (ТПУ) Институт неразрушающего контроля (ИНК) Лаборатория № 42 (Сильноточных бетатронов)
Další autoři: Rychkov M. M. Maksim Mikhailovich, Gentselman V. Valentin
Shrnutí:Title screen
One of the main advantages of small-size betatrons is small focal spot size. However there is no conventional procedure of focal spot size measurement for betatrons. Techniques described in standards are suitable only for low- and mid-energy tubes. The task become more complex if the focal spot size should be estimated quickly using modern digital detectors. In this paper we present preliminary results of focal spot size measurement of a 4 MeV small-size betatron with two different procedures using digital x-ray detector.
Режим доступа: по договору с организацией-держателем ресурса
Jazyk:angličtina
Vydáno: 2016
Témata:
On-line přístup:http://dx.doi.org/10.1088/1742-6596/671/1/012058
http://earchive.tpu.ru/handle/11683/33765
Médium: Elektronický zdroj Kapitola
KOHA link:https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=647220