Focal Spot Size Estimation for a 4 MeV Small-size Betatron Using Digital X-ray Detector; Journal of Physics: Conference Series; Vol. 671 : Innovations in Non-Destructive Testing (SibTest 2015)

Dades bibliogràfiques
Parent link:Journal of Physics: Conference Series
Vol. 671 : Innovations in Non-Destructive Testing (SibTest 2015).— 2016.— [012058, 6 p.]
Autor principal: Sukharnikov K. V. Konstantin Vladimirovich
Autor corporatiu: Национальный исследовательский Томский политехнический университет (ТПУ) Институт неразрушающего контроля (ИНК) Лаборатория № 42 (Сильноточных бетатронов)
Altres autors: Rychkov M. M. Maksim Mikhailovich, Gentselman V. Valentin
Sumari:Title screen
One of the main advantages of small-size betatrons is small focal spot size. However there is no conventional procedure of focal spot size measurement for betatrons. Techniques described in standards are suitable only for low- and mid-energy tubes. The task become more complex if the focal spot size should be estimated quickly using modern digital detectors. In this paper we present preliminary results of focal spot size measurement of a 4 MeV small-size betatron with two different procedures using digital x-ray detector.
Режим доступа: по договору с организацией-держателем ресурса
Idioma:anglès
Publicat: 2016
Matèries:
Accés en línia:http://dx.doi.org/10.1088/1742-6596/671/1/012058
http://earchive.tpu.ru/handle/11683/33765
Format: MixedMaterials Electrònic Capítol de llibre
KOHA link:https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=647220