Simulation of Surface Oscillation of Ultrasound Sensor Based on Piezoelectric Semiconductor Transducer; Journal of Physics: Conference Series; Vol. 671 : Innovations in Non-Destructive Testing (SibTest 2015)

Simulation of Surface Oscillation of Ultrasound Sensor Based on Piezoelectric Semiconductor Transducer; Journal of Physics: Conference Series; Vol. 671 : Innovations in Non-Destructive Testing (SibTest 2015)

Détails bibliographiques
Parent link:	Journal of Physics: Conference Series Vol. 671 : Innovations in Non-Destructive Testing (SibTest 2015).— 2016.— [012054, 6 p.]
Collectivité auteur:	Национальный исследовательский Томский политехнический университет (ТПУ) Институт неразрушающего контроля (ИНК) Кафедра промышленной и медицинской электроники (ПМЭ)
Autres auteurs:	Soldatov A. I. Aleksey Ivanovich, Soldatov A. A. Andrey Alekseevich, Kostina M. A. Maria Alekseevna, Tolkatchev V. F.
Résumé:	Title screen In the article theoretical and experimental studies of the surface deformation of piezoelectric sensors are carried out. Round membrane was used as a model of piezoelectric sensors. Experimental studies were conducted on mass-produced sensors and self-made sensor. Good match fluctuations in membrane model with fixed edges real sensors is shown. Режим доступа: по договору с организацией-держателем ресурса
Langue:	anglais
Publié:	2016
Sujets:	электронный ресурс труды учёных ТПУ поверхностные колебания ультразвуковые датчики полупроводники преобразователи деформации поверхности пьезоэлектрические датчики
Accès en ligne:	http://dx.doi.org/10.1088/1742-6596/671/1/012054 http://earchive.tpu.ru/handle/11683/33761
Format:	Électronique Chapitre de livre
KOHA link:	https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=647212

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