Effect of powerful pulsed and continuous ion beams on the Al-Cu-Mg alloy structure; IOP Conference Series: Materials Science and Engineering; Vol. 110 : Radiation-Thermal Effects and Processes in Inorganic Materials (RTEP2015)
| Parent link: | IOP Conference Series: Materials Science and Engineering Vol. 110 : Radiation-Thermal Effects and Processes in Inorganic Materials (RTEP2015).— 2016.— [012102, 5 p.] |
|---|---|
| Corporate Author: | Национальный исследовательский Томский политехнический университет (ТПУ) Физико-технический институт (ФТИ) Кафедра экспериментальной физики (ЭФ) |
| Other Authors: | Gushchina N. V., Makhin'ko F. F., Ovchinnikov V. V., Gusel'nikov V. I., Remnev G. E. Gennady Efimovich |
| Summary: | Title screen The paper considers the results of an electron microscopy study of the VD1 alloy of the Al-Cu-Mg system after cold working and subsequent irradiation with a powerful pulsed ion beam (70% C[+] + 30% H[+], Е=180 keV) in the pulsed-periodic mode ([tau] = 80 ns, f = 0.1 Hz, j = 200 A/cm{2}, F = 1·10{14} cm{-2}) and under the conditions of the generation of only one pulse ([tau] = 180 ns, j = 100 A/cm{2}, F = 2·10{15} cm{-2}). It is established that this irradiation noticeably affects the microstructure of the cold-worked 3 mm thick sheets of VD1 alloy. The initial cellular dislocation structure transforms into a subgrain one. The intensity of structural transformations in the alloy increases with ion current density of a pulse. A similar transformation of a dislocation structure over the entire thickness of the sample is observed under irradiation with continuous Ar{+} ion beams (Е = 20-40 keV) with not high fluences (10{15}-10{16} cm{-2}). Режим доступа: по договору с организацией-держателем ресурса |
| Language: | English |
| Published: |
2016
|
| Subjects: | |
| Online Access: | http://dx.doi.org/10.1088/1757-899X/110/1/012102 http://earchive.tpu.ru/handle/11683/18111 |
| Format: | Electronic Book Chapter |
| KOHA link: | https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=647079 |
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