Assessment of quartz materials crystallinity by x-ray diffraction; IOP Conference Series: Materials Science and Engineering; Vol. 110 : Radiation-Thermal Effects and Processes in Inorganic Materials (RTEP2015)
| Parent link: | IOP Conference Series: Materials Science and Engineering Vol. 110 : Radiation-Thermal Effects and Processes in Inorganic Materials (RTEP2015).— 2016.— [012095, 4 p.] |
|---|---|
| Collectivité auteur: | Национальный исследовательский Томский политехнический университет (ТПУ) Институт природных ресурсов (ИПР) Кафедра геологии и разведки полезных ископаемых (ГРПИ) |
| Autres auteurs: | Korovkin M. V. Mikhail Vladimirovich, Ananieva L. G. Ludmila Gennadievna, Nebera T., Antsiferova A. |
| Résumé: | Title screen The estimated degree of crystallinity of natural and synthetic grown quartz and quartzite by calculating the x-ray diffraction patterns. It is shown that the index of crystallinity of natural quartzite varies widely, reflecting the different degree of their transformation. The highest values of the index of crystallinity are characterized natural and synthetic single crystals of quartz. Режим доступа: по договору с организацией-держателем ресурса |
| Langue: | anglais |
| Publié: |
2016
|
| Sujets: | |
| Accès en ligne: | http://dx.doi.org/10.1088/1757-899X/110/1/012095 http://earchive.tpu.ru/handle/11683/18104 |
| Format: | Électronique Chapitre de livre |
| KOHA link: | https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=647068 |
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