Assessment of quartz materials crystallinity by x-ray diffraction; IOP Conference Series: Materials Science and Engineering; Vol. 110 : Radiation-Thermal Effects and Processes in Inorganic Materials (RTEP2015)

Xehetasun bibliografikoak
Parent link:IOP Conference Series: Materials Science and Engineering
Vol. 110 : Radiation-Thermal Effects and Processes in Inorganic Materials (RTEP2015).— 2016.— [012095, 4 p.]
Erakunde egilea: Национальный исследовательский Томский политехнический университет (ТПУ) Институт природных ресурсов (ИПР) Кафедра геологии и разведки полезных ископаемых (ГРПИ)
Beste egile batzuk: Korovkin M. V. Mikhail Vladimirovich, Ananieva L. G. Ludmila Gennadievna, Nebera T., Antsiferova A.
Gaia:Title screen
The estimated degree of crystallinity of natural and synthetic grown quartz and quartzite by calculating the x-ray diffraction patterns. It is shown that the index of crystallinity of natural quartzite varies widely, reflecting the different degree of their transformation. The highest values of the index of crystallinity are characterized natural and synthetic single crystals of quartz.
Режим доступа: по договору с организацией-держателем ресурса
Hizkuntza:ingelesa
Argitaratua: 2016
Gaiak:
Sarrera elektronikoa:http://dx.doi.org/10.1088/1757-899X/110/1/012095
http://earchive.tpu.ru/handle/11683/18104
Formatua: Baliabide elektronikoa Liburu kapitulua
KOHA link:https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=647068
Deskribapena
Gaia:Title screen
The estimated degree of crystallinity of natural and synthetic grown quartz and quartzite by calculating the x-ray diffraction patterns. It is shown that the index of crystallinity of natural quartzite varies widely, reflecting the different degree of their transformation. The highest values of the index of crystallinity are characterized natural and synthetic single crystals of quartz.
Режим доступа: по договору с организацией-держателем ресурса
DOI:10.1088/1757-899X/110/1/012095