Detection and defect correction of operating process; IOP Conference Series: Materials Science and Engineering; Vol. 110 : Radiation-Thermal Effects and Processes in Inorganic Materials (RTEP2015)

Detaylı Bibliyografya
Parent link:IOP Conference Series: Materials Science and Engineering
Vol. 110 : Radiation-Thermal Effects and Processes in Inorganic Materials (RTEP2015).— 2016.— [012070, 4 p.]
Müşterek Yazar: Национальный исследовательский Томский политехнический университет (ТПУ) Институт неразрушающего контроля (ИНК) Кафедра физических методов и приборов контроля качества (ФМПК)
Diğer Yazarlar: Vasendina E. A. Elena Aleksandrovna, Plotnikova I. V. Inna Vasilievna, Levitskaya A. Anastasiya, Kvesko S. Svetlana
Özet:Title screen
The article is devoted to the current problem of enterprise competitiveness rise in hard and competitive terms of business environment. The importance of modern equipment for detection of defects and their correction is explained. Production of chipboard is used as an object of research. Short description and main results of estimation efficiency of innovative solutions of enterprises are considered.
Режим доступа: по договору с организацией-держателем ресурса
Dil:İngilizce
Baskı/Yayın Bilgisi: 2016
Konular:
Online Erişim:http://dx.doi.org/10.1088/1757-899X/110/1/012070
http://earchive.tpu.ru/handle/11683/18081
Materyal Türü: Elektronik Kitap Bölümü
KOHA link:https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=647039

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