Detection and defect correction of operating process; IOP Conference Series: Materials Science and Engineering; Vol. 110 : Radiation-Thermal Effects and Processes in Inorganic Materials (RTEP2015)

书目详细资料
Parent link:IOP Conference Series: Materials Science and Engineering
Vol. 110 : Radiation-Thermal Effects and Processes in Inorganic Materials (RTEP2015).— 2016.— [012070, 4 p.]
企业作者: Национальный исследовательский Томский политехнический университет (ТПУ) Институт неразрушающего контроля (ИНК) Кафедра физических методов и приборов контроля качества (ФМПК)
其他作者: Vasendina E. A. Elena Aleksandrovna, Plotnikova I. V. Inna Vasilievna, Levitskaya A. Anastasiya, Kvesko S. Svetlana
总结:Title screen
The article is devoted to the current problem of enterprise competitiveness rise in hard and competitive terms of business environment. The importance of modern equipment for detection of defects and their correction is explained. Production of chipboard is used as an object of research. Short description and main results of estimation efficiency of innovative solutions of enterprises are considered.
Режим доступа: по договору с организацией-держателем ресурса
语言:英语
出版: 2016
主题:
在线阅读:http://dx.doi.org/10.1088/1757-899X/110/1/012070
http://earchive.tpu.ru/handle/11683/18081
格式: 电子 本书章节
KOHA link:https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=647039