Deterioration of Watt and Voltage Characteristics of AlGaInP Heterostructures under Irradiation by Fast Neutrons
| Parent link: | IOP Conference Series: Materials Science and Engineering Vol. 110 : Radiation-Thermal Effects and Processes in Inorganic Materials (RTEP2015).— 2016.— [012026, 5 p.] |
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| Sumari: | Title screen The paper presents the results of studying characteristic deterioration of AlGaInP heterostructures with multiple quantum wells. The research was completed for light emitting diodes (emission wavelengths 623 nm and 590 nm) under fast neutron irradiation in passive mode. It has been revealed that the change in emission power and operating current under irradiation is conditioned by band gap and level of electron injection. Here, the change of current flowing mechanism is a distinctive parameter of the boundary between the first and second stages of emission power reduction caused by fast neutron irradiation of AlGaInP heterostructures ([lambda]=625 nm). Режим доступа: по договору с организацией-держателем ресурса |
| Idioma: | anglès |
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2016
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| Accés en línia: | http://dx.doi.org/10.1088/1757-899X/110/1/012026 http://earchive.tpu.ru/handle/11683/18064 |
| Format: | Electrònic Capítol de llibre |
| KOHA link: | https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=647005 |
| Sumari: | Title screen The paper presents the results of studying characteristic deterioration of AlGaInP heterostructures with multiple quantum wells. The research was completed for light emitting diodes (emission wavelengths 623 nm and 590 nm) under fast neutron irradiation in passive mode. It has been revealed that the change in emission power and operating current under irradiation is conditioned by band gap and level of electron injection. Here, the change of current flowing mechanism is a distinctive parameter of the boundary between the first and second stages of emission power reduction caused by fast neutron irradiation of AlGaInP heterostructures ([lambda]=625 nm). Режим доступа: по договору с организацией-держателем ресурса |
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| DOI: | 10.1088/1757-899X/110/1/012026 |