Sharpness Assessment of Images Obtained with a Laser Monitor; Micro/Nanotechnologies and Electron Devices (EDM)
| Parent link: | Micro/Nanotechnologies and Electron Devices (EDM).— 2015.— [P. 340-342] |
|---|---|
| Main Author: | |
| Other Authors: | , |
| Summary: | Title screen This paper presents the experimental results obtained using two image quality assessment methods. The possibility of using these methods in the laser monitor autofocus system is studied. Based on mathematical algorithms the software for image brightness assessment has been developed in MatLab. The image sharpness for brightness amplifiers operating at different wavelengths is compared. Режим доступа: по договору с организацией-держателем ресурса |
| Language: | English |
| Published: |
2015
|
| Subjects: | |
| Online Access: | http://dx.doi.org/10.1109/EDM.2015.7184559 |
| Format: | Electronic Book Chapter |
| KOHA link: | https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=646978 |
MARC
| LEADER | 00000naa0a2200000 4500 | ||
|---|---|---|---|
| 001 | 646978 | ||
| 005 | 20250611095128.0 | ||
| 035 | |a (RuTPU)RU\TPU\network\12115 | ||
| 090 | |a 646978 | ||
| 100 | |a 20160322d2015 k||y0rusy50 ba | ||
| 101 | 0 | |a eng | |
| 135 | |a drgn ---uucaa | ||
| 181 | 0 | |a i | |
| 182 | 0 | |a b | |
| 200 | 1 | |a Sharpness Assessment of Images Obtained with a Laser Monitor |f D. S. Chertikhina, M. V. Trigub, T. G. Evtushenko | |
| 203 | |a Text |c electronic | ||
| 300 | |a Title screen | ||
| 320 | |a [References: p. 342 (15 tit.)] | ||
| 330 | |a This paper presents the experimental results obtained using two image quality assessment methods. The possibility of using these methods in the laser monitor autofocus system is studied. Based on mathematical algorithms the software for image brightness assessment has been developed in MatLab. The image sharpness for brightness amplifiers operating at different wavelengths is compared. | ||
| 333 | |a Режим доступа: по договору с организацией-держателем ресурса | ||
| 463 | |t Micro/Nanotechnologies and Electron Devices (EDM) |o 16th International Conference of Young Specialists, Erlagol, June 29 -July 3 |f Novosibirsk State Technical University |v [P. 340-342] |d 2015 | ||
| 610 | 1 | |a электронный ресурс | |
| 610 | 1 | |a труды учёных ТПУ | |
| 700 | 1 | |a Chertikhina |b D. S. |g Darjya Sergeevna | |
| 701 | 1 | |a Trigub |b M. V. |c specialist in the field of non-destructive testing |c Professor of Tomsk Polytechnic University, Doctor of technical sciences |f 1987- |g Maksim Viktorovich |3 (RuTPU)RU\TPU\pers\31242 |9 15437 | |
| 701 | 1 | |a Evtushenko |b T. G. |g Tatjyana Gennadjevna | |
| 801 | 2 | |a RU |b 63413507 |c 20160322 |g RCR | |
| 850 | |a 63413507 | ||
| 856 | 4 | |u http://dx.doi.org/10.1109/EDM.2015.7184559 | |
| 942 | |c CF | ||