Structural Changes of Titanium Dioxide Thin Films Deposited by Reactive Magnetron Sputtering through Nitrogen Incorporation; Key Engineering Materials; Vol. 683 : Multifunctional Materials: Development and Application

Manylion Llyfryddiaeth
Parent link:Key Engineering Materials: Scientific Journal
Vol. 683 : Multifunctional Materials: Development and Application.— 2016.— [P. 383-388]
Prif Awdur: Pustovalova A. A. Alla Aleksandrovna
Awdur Corfforaethol: Национальный исследовательский Томский политехнический университет (ТПУ) Физико-технический институт (ФТИ) Кафедра экспериментальной физики (ЭФ)
Awduron Eraill: Ivanova N. M. Nina Mikhailovna
Crynodeb:Title screen
This paper presents the results of the studies of the structure and chemical composition of nitrogen-doped titanium dioxide thin films obtained by reactive magnetron sputtering deposition. The XRD data show the changes of the structure and phase composition of titanium dioxide thin films due to the nitrogen doping. The change of the films structure increases with the growth of the nitrogen content. The reduction of crystallites size takes place at the increase of the nitrogen concentration. Chemical bonds present in the films were examined by FTIR spectroscopy.
Режим доступа: по договору с организацией-держателем ресурса
Iaith:Saesneg
Cyhoeddwyd: 2016
Cyfres:Physicochemical Properties of Materials and Current Processing Technologies
Pynciau:
Mynediad Ar-lein:http://dx.doi.org/10.4028/www.scientific.net/KEM.683.383
Fformat: Electronig Pennod Llyfr
KOHA link:https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=646637

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