The Structure and Properties of Yttrium-Stabilized Zirconium Dioxide Ceramics Treated by Electron Beam; Key Engineering Materials; Vol. 683 : Multifunctional Materials: Development and Application
| Parent link: | Key Engineering Materials: Scientific Journal Vol. 683 : Multifunctional Materials: Development and Application.— 2016.— [P. 53-57] |
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| 団体著者: | |
| その他の著者: | , , , , |
| 要約: | Title screen The high-intensity electron-beam treatment of the submillisecond duration is used to treat the surface layer of sintered zirconium dioxide ceramics partially stabilized by yttrium. The electron beam irradiation parameters are obtained allowing the structural modification under a rapid solidification. It is shown that the structural modification of ceramics under melting conditions with the subsequent rapid solidification is accompanied by the formation of a sub-microcrystalline structure that fosters a multiple magnification (≈ 2 times) of the modified layer hardness. Режим доступа: по договору с организацией-держателем ресурса |
| 言語: | 英語 |
| 出版事項: |
2016
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| シリーズ: | Physicochemical Properties of Materials and Current Processing Technologies |
| 主題: | |
| オンライン・アクセス: | http://dx.doi.org/10.4028/www.scientific.net/KEM.683.53 |
| フォーマット: | 電子媒体 図書の章 |
| KOHA link: | https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=646595 |
| 要約: | Title screen The high-intensity electron-beam treatment of the submillisecond duration is used to treat the surface layer of sintered zirconium dioxide ceramics partially stabilized by yttrium. The electron beam irradiation parameters are obtained allowing the structural modification under a rapid solidification. It is shown that the structural modification of ceramics under melting conditions with the subsequent rapid solidification is accompanied by the formation of a sub-microcrystalline structure that fosters a multiple magnification (≈ 2 times) of the modified layer hardness. Режим доступа: по договору с организацией-держателем ресурса |
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| DOI: | 10.4028/www.scientific.net/KEM.683.53 |