A novel data processing algorithm in thermal property measurement and defect detection by using one-sided active infrared thermography; Proceedings of SPIE; Vol. 9485 : Thermosense: Thermal Infrared Applications XXXVII

Bibliographic Details
Parent link:Proceedings of SPIE
Vol. 9485 : Thermosense: Thermal Infrared Applications XXXVII.— 2015.— [94850V, 7 p.]
Main Author: Vavilov V. P. Vladimir Platonovich
Corporate Author: Национальный исследовательский Томский политехнический университет (ТПУ) Институт неразрушающего контроля (ИНК) Лаборатория № 34 (Тепловых методов контроля)
Other Authors: Shiryaev V. V. Vladimir Vasilyevich, Chulkov A. O. Arseniy Olegovich
Summary:Title screen
The proposed algorithm is based on the analysis of an artificial front-surface pixel-based function which includes temperature and time. This function experiences certain extremums, and the corresponding times can be used for determining thermal diffusivity by the formula similar to the known Parker expression. In thermal NDT, such approach being applied to defect areas, provides diffusivity variations which can be used for the evaluation of defect severity in a particular specimen. In this study, both the theoretical basis and the some experimental implementations of the proposed data processing algorithm have been explored to illustrate its validity in thermal properties measurement and thermal NDT, including thermal tomography.
Режим доступа: по договору с организацией-держателем ресурса
Language:English
Published: 2015
Subjects:
Online Access:http://dx.doi.org/10.1117/12.2175645
Format: Electronic Book Chapter
KOHA link:https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=646179

MARC

LEADER 00000naa0a2200000 4500
001 646179
005 20250604134627.0
035 |a (RuTPU)RU\TPU\network\11313 
090 |a 646179 
100 |a 20160215d2015 k||y0rusy50 ba 
101 0 |a eng 
135 |a drcn ---uucaa 
181 0 |a i  
182 0 |a b 
200 1 |a A novel data processing algorithm in thermal property measurement and defect detection by using one-sided active infrared thermography  |f V. P. Vavilov, V. V. Shiryaev, A. O. Chulkov 
203 |a Text  |c electronic 
300 |a Title screen 
330 |a The proposed algorithm is based on the analysis of an artificial front-surface pixel-based function which includes temperature and time. This function experiences certain extremums, and the corresponding times can be used for determining thermal diffusivity by the formula similar to the known Parker expression. In thermal NDT, such approach being applied to defect areas, provides diffusivity variations which can be used for the evaluation of defect severity in a particular specimen. In this study, both the theoretical basis and the some experimental implementations of the proposed data processing algorithm have been explored to illustrate its validity in thermal properties measurement and thermal NDT, including thermal tomography. 
333 |a Режим доступа: по договору с организацией-держателем ресурса 
461 |t Proceedings of SPIE 
463 |t Vol. 9485 : Thermosense: Thermal Infrared Applications XXXVII  |v [94850V, 7 p.]  |d 2015 
610 1 |a электронный ресурс 
610 1 |a труды учёных ТПУ 
700 1 |a Vavilov  |b V. P.  |c Specialist in the field of dosimetry and methodology of nondestructive testing (NDT)  |c Doctor of technical sciences (DSc), Professor of Tomsk Polytechnic University (TPU)  |f 1949-  |g Vladimir Platonovich  |3 (RuTPU)RU\TPU\pers\32161  |9 16163 
701 1 |a Shiryaev  |b V. V.  |c specialist in the field of non-destructive testing  |c Senior researcher of Tomsk Polytechnic University, Candidate of technical sciences  |f 1948-  |g Vladimir Vasilyevich  |3 (RuTPU)RU\TPU\pers\32219  |9 16219 
701 1 |a Chulkov  |b A. O.  |c specialist in the field of non-destructive testing  |c Deputy Director for Scientific and Educational Activities; acting manager; Senior Researcher, Tomsk Polytechnic University, Candidate of Technical Sciences  |f 1989-  |g Arseniy Olegovich  |3 (RuTPU)RU\TPU\pers\32220  |9 16220 
712 0 2 |a Национальный исследовательский Томский политехнический университет (ТПУ)  |b Институт неразрушающего контроля (ИНК)  |b Лаборатория № 34 (Тепловых методов контроля)  |3 (RuTPU)RU\TPU\col\19616 
801 2 |a RU  |b 63413507  |c 20160215  |g RCR 
850 |a 63413507 
856 4 |u http://dx.doi.org/10.1117/12.2175645 
942 |c CF