Investigation of active optical systems for remote object visualization; Micro/Nanotechnologies and Electron Devices (EDM)

Investigation of active optical systems for remote object visualization; Micro/Nanotechnologies and Electron Devices (EDM)

Podrobná bibliografie
Parent link:Micro/Nanotechnologies and Electron Devices (EDM).— 2015.— [P. 321-324]
Hlavní autor: Trigub M. V. Maksim Viktorovich
Korporativní autor: Национальный исследовательский Томский политехнический университет (ТПУ) Институт неразрушающего контроля (ИНК) Кафедра промышленной и медицинской электроники (ПМЭ)
Další autoři: Fedorov K. V. Kirill Valerjevich, Evtushenko G. S. Gennady Sergeevich
Shrnutí:Title screen
The paper presents the results of object visualization with the laser monitor system at different distances between the object and the brightness amplifier. In spite of the fact that CuBr-laser active medium has a high gain and works in a saturation mode, an increase in distance leads to a significant reduction of the image contrast. At a distance of more than 4 m the image becomes indistinguishable. To increase the maximum distance between the object and the brightness amplifier the laser monitor with a plane-parallel quartz plate is used. Also theoretical and experimental dependences for the feld of view of the active optical system on the distance between the object and the brightness amplifer (laser monitor, laser projection microscope) have been studied.
Режим доступа: по договору с организацией-держателем ресурса
Jazyk:angličtina
Vydáno: 2015
Témata:
электронный ресурс
труды учёных ТПУ
лазерные микроскопы
мониторинг
On-line přístup:http://dx.doi.org/10.1109/EDM.2015.7184554
Médium: Elektronický zdroj Kapitola
KOHA link:https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=645917

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