Investigation of active optical systems for remote object visualization; Micro/Nanotechnologies and Electron Devices (EDM)
| Parent link: | Micro/Nanotechnologies and Electron Devices (EDM).— 2015.— [P. 321-324] |
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| Daljnji autori: | , |
| Sažetak: | Title screen The paper presents the results of object visualization with the laser monitor system at different distances between the object and the brightness amplifier. In spite of the fact that CuBr-laser active medium has a high gain and works in a saturation mode, an increase in distance leads to a significant reduction of the image contrast. At a distance of more than 4 m the image becomes indistinguishable. To increase the maximum distance between the object and the brightness amplifier the laser monitor with a plane-parallel quartz plate is used. Also theoretical and experimental dependences for the feld of view of the active optical system on the distance between the object and the brightness amplifer (laser monitor, laser projection microscope) have been studied. Режим доступа: по договору с организацией-держателем ресурса |
| Jezik: | engleski |
| Izdano: |
2015
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| Online pristup: | http://dx.doi.org/10.1109/EDM.2015.7184554 |
| Format: | Elektronički Poglavlje knjige |
| KOHA link: | https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=645917 |
| Sažetak: | Title screen The paper presents the results of object visualization with the laser monitor system at different distances between the object and the brightness amplifier. In spite of the fact that CuBr-laser active medium has a high gain and works in a saturation mode, an increase in distance leads to a significant reduction of the image contrast. At a distance of more than 4 m the image becomes indistinguishable. To increase the maximum distance between the object and the brightness amplifier the laser monitor with a plane-parallel quartz plate is used. Also theoretical and experimental dependences for the feld of view of the active optical system on the distance between the object and the brightness amplifer (laser monitor, laser projection microscope) have been studied. Режим доступа: по договору с организацией-держателем ресурса |
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| Digitalni identifikator objekta: | 10.1109/EDM.2015.7184554 |