Soft-x-ray Cherenkov radiation generated by a charged particle moving near a finite-size screen
| Parent link: | Physical Review A: Atomic, Molecular, and Optical Physics.— , 1970- Vol. 92, iss. 5.— 2015.— [053851, 14 p.] |
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| Main Author: | |
| Corporate Author: | |
| Other Authors: | , |
| Summary: | Title screen This paper demonstrates the application of a polarization current approach to estimate the yield of soft x-ray Cherenkov radiation when a charged particle travels in the vicinity of a finite-size screen. To account for resonant anomalous dispersion of the complex permittivity, we apply the formalism for the atomic scattering factor. We derived the simple analytical expression for the radiation field, which allows us to determine all properties for a wide energy range of emitted radiation of a charged particle. The influence of screen sizes on Cherenkov radiation characteristics is determined by macroscopic and microscopic approaches. Режим доступа: по договору с организацией-держателем ресурса |
| Language: | English |
| Published: |
2015
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| Subjects: | |
| Online Access: | http://dx.doi.org/10.1103/PhysRevA.92.053851 |
| Format: | Electronic Book Chapter |
| KOHA link: | https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=645893 |
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| 200 | 1 | |a Soft-x-ray Cherenkov radiation generated by a charged particle moving near a finite-size screen |f M. V. Shevelev, A. S. Konkov (Kon'kov), A. S. Aryshev | |
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| 300 | |a Title screen | ||
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| 330 | |a This paper demonstrates the application of a polarization current approach to estimate the yield of soft x-ray Cherenkov radiation when a charged particle travels in the vicinity of a finite-size screen. To account for resonant anomalous dispersion of the complex permittivity, we apply the formalism for the atomic scattering factor. We derived the simple analytical expression for the radiation field, which allows us to determine all properties for a wide energy range of emitted radiation of a charged particle. The influence of screen sizes on Cherenkov radiation characteristics is determined by macroscopic and microscopic approaches. | ||
| 333 | |a Режим доступа: по договору с организацией-держателем ресурса | ||
| 461 | |t Physical Review A |o Atomic, Molecular, and Optical Physics |o Scientific Journal |d 1970- | ||
| 463 | |t Vol. 92, iss. 5 |v [053851, 14 p.] |d 2015 | ||
| 610 | 1 | |a электронный ресурс | |
| 610 | 1 | |a труды учёных ТПУ | |
| 610 | 1 | |a X-Ray | |
| 610 | 1 | |a черенковское излучение | |
| 700 | 1 | |a Shevelev |b M. V. |g Mihail Viktorovich | |
| 701 | 1 | |a Konkov (Kon'kov) |b A. S. |c physicist |c design engineer of Tomsk Polytechnic University |f 1987- |g Anatoliy Sergeevich |3 (RuTPU)RU\TPU\pers\31535 | |
| 701 | 1 | |a Aryshev |b A. S. |g Aleksandr Sergeevich | |
| 712 | 0 | 2 | |a Национальный исследовательский Томский политехнический университет (ТПУ) |b Физико-технический институт (ФТИ) |b Кафедра прикладной физики (№ 12) (ПФ) |b Инновационная международная научно-образовательная лаборатория "Фотон" (ИМНОЛ "Фотон") |3 (RuTPU)RU\TPU\col\20731 |
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