Review of pulsed thermal NDT: Physical principles, theory and data processing; NDT & E International; Vol. 73

Dettagli Bibliografici
Parent link:NDT & E International: Scientific Journal
Vol. 73.— 2015.— [P. 28–52]
Autore principale: Vavilov V. P. Vladimir Platonovich
Ente Autore: Национальный исследовательский Томский политехнический университет (ТПУ) Институт неразрушающего контроля (ИНК) Лаборатория № 34 (Тепловых методов контроля)
Altri autori: Burleigh D. D. Douglas
Riassunto:Title screen
This paper summarizes the basics of pulsed thermal nondestructive testing (TNDT) including theoretical solutions, data processing algorithms and practical implementation. Typical defects are discussed along with 1D analytical and multi-dimensional numerical solutions. Special emphasis is focused on defect characterization by the use of inverse solutions. A list of TNDT terms is provided. Applications of active TNDT, mainly in the aerospace industry, are discussed briefly, and some trends in the further development of this technique are described.
Режим доступа: по договору с организацией-держателем ресурса
Lingua:inglese
Pubblicazione: 2015
Soggetti:
Accesso online:http://dx.doi.org/10.1016/j.ndteint.2015.03.003
Natura: Elettronico Capitolo di libro
KOHA link:https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=645524

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