Review of pulsed thermal NDT: Physical principles, theory and data processing; NDT & E International; Vol. 73
| Parent link: | NDT & E International: Scientific Journal Vol. 73.— 2015.— [P. 28–52] |
|---|---|
| मुख्य लेखक: | Vavilov V. P. Vladimir Platonovich |
| निगमित लेखक: | Национальный исследовательский Томский политехнический университет (ТПУ) Институт неразрушающего контроля (ИНК) Лаборатория № 34 (Тепловых методов контроля) |
| अन्य लेखक: | Burleigh D. D. Douglas |
| सारांश: | Title screen This paper summarizes the basics of pulsed thermal nondestructive testing (TNDT) including theoretical solutions, data processing algorithms and practical implementation. Typical defects are discussed along with 1D analytical and multi-dimensional numerical solutions. Special emphasis is focused on defect characterization by the use of inverse solutions. A list of TNDT terms is provided. Applications of active TNDT, mainly in the aerospace industry, are discussed briefly, and some trends in the further development of this technique are described. Режим доступа: по договору с организацией-держателем ресурса |
| भाषा: | अंग्रेज़ी |
| प्रकाशित: |
2015
|
| विषय: | |
| ऑनलाइन पहुंच: | http://dx.doi.org/10.1016/j.ndteint.2015.03.003 |
| स्वरूप: | इलेक्ट्रोनिक पुस्तक अध्याय |
| KOHA link: | https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=645524 |
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समान संसाधन
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प्रकाशित: (2022) -
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प्रकाशित: (2022) -
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प्रकाशित: (2014) -
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