Spectral analysis of nanosize forms of carbon synthesized by pulsed intense ion beams; Vacuum; Vol. 89

Dettagli Bibliografici
Parent link:Vacuum
Vol. 89.— 2013.— [P. 118–121]
Ente Autore: Национальный исследовательский Томский политехнический университет (ТПУ) Институт физики высоких технологий (ИФВТ) Лаборатория № 1
Altri autori: Remnev (Remnyov) G. E. Gennady Efimovich, Uglov V. V. Vladimir Vasilievich, Shimanskii (Shymanski) V. I. Vitali Igorevich, Konarski P., Samtsov M. P., Pavlov S. K. Sergey Konstantinovich, Lapchuk N. M.
Riassunto:Title screen
The research results of nanodiamond formation in silicon during high intense ion implantation are presented. To produce a near-surface layer containing nanodiamond clusters a pulse ion implantation of carbon ions with different ion current densities (25-100cA/cm2) and pulse numbers (10-500) was used. According to the Raman spectroscopy and electron paramagnetic resonance data the optimal parameters of ion implantation resulting in nanodiamond formation were found. Nanodiamonds are formed in the internal layer due to ion implantation with low pulse number (less than 100) and high ion current density (70-80 A/cm2). An increase in pulse number results in amorphization of the implanted layer due to hydrogen atom accumulation that was revealed by the secondary ion mass-spectroscopy (SIMS) method.
Режим доступа: по договору с организацией-держателем ресурса
Lingua:inglese
Pubblicazione: 2013
Soggetti:
Accesso online:http://dx.doi.org/10.1016/j.vacuum.2012.02.037
Natura: Elettronico Capitolo di libro
KOHA link:https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=645361

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200 1 |a Spectral analysis of nanosize forms of carbon synthesized by pulsed intense ion beams  |f G. E. Remnev [et al.] 
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300 |a Title screen 
320 |a [References: p. 121 (21 tit.)] 
330 |a The research results of nanodiamond formation in silicon during high intense ion implantation are presented. To produce a near-surface layer containing nanodiamond clusters a pulse ion implantation of carbon ions with different ion current densities (25-100cA/cm2) and pulse numbers (10-500) was used. According to the Raman spectroscopy and electron paramagnetic resonance data the optimal parameters of ion implantation resulting in nanodiamond formation were found. Nanodiamonds are formed in the internal layer due to ion implantation with low pulse number (less than 100) and high ion current density (70-80 A/cm2). An increase in pulse number results in amorphization of the implanted layer due to hydrogen atom accumulation that was revealed by the secondary ion mass-spectroscopy (SIMS) method. 
333 |a Режим доступа: по договору с организацией-держателем ресурса 
461 |t Vacuum 
463 |t Vol. 89  |v [P. 118–121]  |d 2013 
610 1 |a электронный ресурс 
610 1 |a труды учёных ТПУ 
610 1 |a high intensity ion implantation 
610 1 |a nanodiamonds 
610 1 |a carbon implantation 
610 1 |a silicon 
610 1 |a raman spectroscopy 
610 1 |a amorphization 
610 1 |a SIMS depth profile analysis 
701 1 |a Remnev (Remnyov)  |b G. E.  |c physicist  |c Professor of Tomsk Polytechnic University, Doctor of technical sciences  |f 1948-  |g Gennady Efimovich  |3 (RuTPU)RU\TPU\pers\31500  |9 15661 
701 1 |a Uglov  |b V. V.  |c Physicist  |c Leading researcher of Tomsk Polytechnic University, Doctor of physical and mathematical sciences  |f 1954-  |g Vladimir Vasilievich  |3 (RuTPU)RU\TPU\pers\36737 
701 1 |a Shimanskii (Shymanski)  |b V. I.  |c Physicist  |c Associate Scientist of Tomsk Polytechnic University, Candidate of physical and mathematical sciences  |f 1986-  |g Vitali Igorevich  |3 (RuTPU)RU\TPU\pers\36738 
701 1 |a Konarski  |b P. 
701 1 |a Samtsov  |b M. P. 
701 1 |a Pavlov  |b S. K.  |c physicist  |c Engineer of Tomsk Polytechnic University  |f 1990-  |g Sergey Konstantinovich  |3 (RuTPU)RU\TPU\pers\32875 
701 1 |a Lapchuk  |b N. M. 
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