Role of Crystallographic Anisotropy in the Formation of Surface Layers of Single NiTi Crystals after Ion-Plasma Alloying; AIP Conference Proceedings; Vol. 1683 : Advanced Materials with Hierarchical Structure for New Technologies and Reliable Structures
| Parent link: | AIP Conference Proceedings Vol. 1683 : Advanced Materials with Hierarchical Structure for New Technologies and Reliable Structures.— 2015.— [020184, 4 p.] |
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| Korporacja: | |
| Kolejni autorzy: | , , , , |
| Streszczenie: | Title screen The structure of the surface and near-surface layers of single crystals of NiTi, differently oriented relative to the direction of ion beam treatment was investigated. The role of the crystallographic orientation in formation of structure of surface layers after ion-plasma alloying was revealed. It was found that the orientation effects of selective sputtering and channeling determine the thickness of the oxide and amorphous layers, the depth of penetration of ions and impurities, the distribution of Ni with depth. Режим доступа: по договору с организацией-держателем ресурса |
| Język: | angielski |
| Wydane: |
2015
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| Hasła przedmiotowe: | |
| Dostęp online: | http://dx.doi.org/10.1063/1.4932874 |
| Format: | Elektroniczne Rozdział |
| KOHA link: | https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=644993 |
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| 200 | 1 | |a Role of Crystallographic Anisotropy in the Formation of Surface Layers of Single NiTi Crystals after Ion-Plasma Alloying |f T. M. Poletika [et al.] | |
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| 300 | |a Title screen | ||
| 320 | |a [References: 7 tit.] | ||
| 330 | |a The structure of the surface and near-surface layers of single crystals of NiTi, differently oriented relative to the direction of ion beam treatment was investigated. The role of the crystallographic orientation in formation of structure of surface layers after ion-plasma alloying was revealed. It was found that the orientation effects of selective sputtering and channeling determine the thickness of the oxide and amorphous layers, the depth of penetration of ions and impurities, the distribution of Ni with depth. | ||
| 333 | |a Режим доступа: по договору с организацией-держателем ресурса | ||
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| 463 | 0 | |0 (RuTPU)RU\TPU\network\9779 |t Vol. 1683 : Advanced Materials with Hierarchical Structure for New Technologies and Reliable Structures |o Proceedings of the International Conference, 21–25 September 2015, Tomsk, Russia |f National Research Tomsk Polytechnic University (TPU) ; ed. V. E. Panin ; S. G. Psakhie ; V. M. Fomin |v [020184, 4 p.] |d 2015 | |
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