Adishchev Yu. N. Yuri Nikolaevich, Didenko A. N. Andrei Nikolaevich, Mun V. V., Pleshkov G. A., Potylitsyn A. P. Alexander Petrovich, Tomchakov V. K., . . . Vorobiev S. A. Sergey Aleksandrovich. (1987). Measurements of parametric X-rays from relativistic electrons in silicon crystals; Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms; Vol. 21, iss. 1-4. 1987. https://doi.org/10.1016/0168-583X(87)90138-8
Cita Chicago (17th ed.)Adishchev Yu. N. Yuri Nikolaevich, Didenko A. N. Andrei Nikolaevich, Mun V. V., Pleshkov G. A., Potylitsyn A. P. Alexander Petrovich, Tomchakov V. K., Uglov S. R. Sergey Romanovich, i Vorobiev S. A. Sergey Aleksandrovich. Measurements of Parametric X-rays from Relativistic Electrons in Silicon Crystals; Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms; Vol. 21, Iss. 1-4. 1987, 1987. https://doi.org/10.1016/0168-583X(87)90138-8.
Cita MLA (9th ed.)Adishchev Yu. N. Yuri Nikolaevich, et al. Measurements of Parametric X-rays from Relativistic Electrons in Silicon Crystals; Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms; Vol. 21, Iss. 1-4. 1987, 1987. https://doi.org/10.1016/0168-583X(87)90138-8.