APA (7th ed.) Citation

Adishchev Yu. N. Yuri Nikolaevich, Didenko A. N. Andrei Nikolaevich, Mun V. V., Pleshkov G. A., Potylitsyn A. P. Alexander Petrovich, Tomchakov V. K., . . . Vorobiev S. A. Sergey Aleksandrovich. (1987). Measurements of parametric X-rays from relativistic electrons in silicon crystals; Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms; Vol. 21, iss. 1-4. 1987. https://doi.org/10.1016/0168-583X(87)90138-8

Chicago Style (17th ed.) Citation

Adishchev Yu. N. Yuri Nikolaevich, Didenko A. N. Andrei Nikolaevich, Mun V. V., Pleshkov G. A., Potylitsyn A. P. Alexander Petrovich, Tomchakov V. K., Uglov S. R. Sergey Romanovich, and Vorobiev S. A. Sergey Aleksandrovich. Measurements of Parametric X-rays from Relativistic Electrons in Silicon Crystals; Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms; Vol. 21, Iss. 1-4. 1987, 1987. https://doi.org/10.1016/0168-583X(87)90138-8.

MLA (9th ed.) Citation

Adishchev Yu. N. Yuri Nikolaevich, et al. Measurements of Parametric X-rays from Relativistic Electrons in Silicon Crystals; Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms; Vol. 21, Iss. 1-4. 1987, 1987. https://doi.org/10.1016/0168-583X(87)90138-8.