Adishchev Yu. N. Yuri Nikolaevich, Didenko A. N. Andrei Nikolaevich, Mun V. V., Pleshkov G. A., Potylitsyn A. P. Alexander Petrovich, Tomchakov V. K., . . . Vorobiev S. A. Sergey Aleksandrovich. (1987). Measurements of parametric X-rays from relativistic electrons in silicon crystals. 1987. https://doi.org/10.1016/0168-583X(87)90138-8
Citação do estilo Chicago (17ª ed.)Adishchev Yu. N. Yuri Nikolaevich, Didenko A. N. Andrei Nikolaevich, Mun V. V., Pleshkov G. A., Potylitsyn A. P. Alexander Petrovich, Tomchakov V. K., Uglov S. R. Sergey Romanovich, e Vorobiev S. A. Sergey Aleksandrovich. Measurements of Parametric X-rays from Relativistic Electrons in Silicon Crystals. 1987, 1987. https://doi.org/10.1016/0168-583X(87)90138-8.
Citação MLA (9ª ed.)Adishchev Yu. N. Yuri Nikolaevich, et al. Measurements of Parametric X-rays from Relativistic Electrons in Silicon Crystals. 1987, 1987. https://doi.org/10.1016/0168-583X(87)90138-8.