Adishchev Yu. N. Yuri Nikolaevich, Didenko A. N. Andrei Nikolaevich, Mun V. V., Pleshkov G. A., Potylitsyn A. P. Alexander Petrovich, Tomchakov V. K., . . . Vorobiev S. A. Sergey Aleksandrovich. (1987). Measurements of parametric X-rays from relativistic electrons in silicon crystals. 1987. https://doi.org/10.1016/0168-583X(87)90138-8
Lua i Stíl Chicago (17ú heag.)Adishchev Yu. N. Yuri Nikolaevich, Didenko A. N. Andrei Nikolaevich, Mun V. V., Pleshkov G. A., Potylitsyn A. P. Alexander Petrovich, Tomchakov V. K., Uglov S. R. Sergey Romanovich, agus Vorobiev S. A. Sergey Aleksandrovich. Measurements of Parametric X-rays from Relativistic Electrons in Silicon Crystals. 1987, 1987. https://doi.org/10.1016/0168-583X(87)90138-8.
Lua MLA (9ú heag.)Adishchev Yu. N. Yuri Nikolaevich, et al. Measurements of Parametric X-rays from Relativistic Electrons in Silicon Crystals. 1987, 1987. https://doi.org/10.1016/0168-583X(87)90138-8.