Evolution of Stress Concentration along CurvilinearModified Surface Layer-Base Material Interface. Numerical Simulation
| Parent link: | AIP Conference Proceedings Vol. 1683 : Advanced Materials with Hierarchical Structure for New Technologies and Reliable Structures.— 2015.— [020018, 4 p.] |
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| Tác giả của công ty: | |
| Tác giả khác: | , , , |
| Tóm tắt: | Title screen The interfacial mechanisms of the stress concentration in materials with modified surface layers are investigated. A dynamic boundary-value problem in a plane-strain formulation is solved numerically by the finitedifference method. Serrated and wavy base material-surface layer interfaces observed experimentally are assigned explicitly in calculations. Two stages in the evolution of the stress concentration are found to occur due to irregular interfacial geometry. The stress concentration in near-interfacial regions turns out to depend on the sinusoidal wavy interface thickness and roughness. Режим доступа: по договору с организацией-держателем ресурса |
| Ngôn ngữ: | Tiếng Anh |
| Được phát hành: |
2015
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| Những chủ đề: | |
| Truy cập trực tuyến: | http://dx.doi.org/10.1063/1.4932708 |
| Định dạng: | Điện tử Chương của sách |
| KOHA link: | https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=644859 |
| Tóm tắt: | Title screen The interfacial mechanisms of the stress concentration in materials with modified surface layers are investigated. A dynamic boundary-value problem in a plane-strain formulation is solved numerically by the finitedifference method. Serrated and wavy base material-surface layer interfaces observed experimentally are assigned explicitly in calculations. Two stages in the evolution of the stress concentration are found to occur due to irregular interfacial geometry. The stress concentration in near-interfacial regions turns out to depend on the sinusoidal wavy interface thickness and roughness. Режим доступа: по договору с организацией-держателем ресурса |
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| DOI: | 10.1063/1.4932708 |