Measurement of spectral and polarization characteristics of parametric X-rays in a Si crystal

Measurement of spectral and polarization characteristics of parametric X-rays in a Si crystal

Bibliographic Details
Parent link:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms: Scientific Journal.— , 1984-
Vol. 44, iss. 2.— 1989.— [P. 130-136]
Other Authors: Adishchev Yu. N. Yuri Nikolaevich, Verzilov V. A., Potylitsyn A. P. Alexander Petrovich, Uglov S. R. Sergey Romanovich, Vorobiev S. A. Sergey Aleksandrovich
Summary:Title screen
Spectral distributions of parametric X-rays (PX) have been measured for 900 MeV electrons transmitted through a Si crystal. A displacement of the PX spectral line was observed with the crystal rotation and in scanning PX radiation reflection by a detector. A high degree of linear polarization (P = 0.8) of parametric X-rays was obtained.
Режим доступа: по договору с организацией-держателем ресурса
Language:English
Published: 1989
Subjects:
электронный ресурс
труды учёных ТПУ
Online Access:http://dx.doi.org/10.1016/0168-583X(89)90417-5
Format: Electronic Book Chapter
KOHA link:https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=644847

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