Measurement of spectral and polarization characteristics of parametric X-rays in a Si crystal; Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms; Vol. 44, iss. 2

Measurement of spectral and polarization characteristics of parametric X-rays in a Si crystal; Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms; Vol. 44, iss. 2

Dades bibliogràfiques
Parent link:	Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms: Scientific Journal.— , 1984- Vol. 44, iss. 2.— 1989.— [P. 130-136]
Altres autors:	Adishchev Yu. N. Yuri Nikolaevich, Verzilov V. A., Potylitsyn A. P. Alexander Petrovich, Uglov S. R. Sergey Romanovich, Vorobiev S. A. Sergey Aleksandrovich
Sumari:	Title screen Spectral distributions of parametric X-rays (PX) have been measured for 900 MeV electrons transmitted through a Si crystal. A displacement of the PX spectral line was observed with the crystal rotation and in scanning PX radiation reflection by a detector. A high degree of linear polarization (P = 0.8) of parametric X-rays was obtained. Режим доступа: по договору с организацией-держателем ресурса
Idioma:	anglès
Publicat:	1989
Matèries:	электронный ресурс труды учёных ТПУ
Accés en línia:	http://dx.doi.org/10.1016/0168-583X(89)90417-5
Format:	Electrònic Capítol de llibre
KOHA link:	https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=644847

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