Measurement of spectral and polarization characteristics of parametric X-rays in a Si crystal
| Parent link: | Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms: Scientific Journal.— , 1984- Vol. 44, iss. 2.— 1989.— [P. 130-136] |
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| Další autoři: | , , , , |
| Shrnutí: | Title screen Spectral distributions of parametric X-rays (PX) have been measured for 900 MeV electrons transmitted through a Si crystal. A displacement of the PX spectral line was observed with the crystal rotation and in scanning PX radiation reflection by a detector. A high degree of linear polarization (P = 0.8) of parametric X-rays was obtained. Режим доступа: по договору с организацией-держателем ресурса |
| Jazyk: | angličtina |
| Vydáno: |
1989
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| Témata: | |
| On-line přístup: | http://dx.doi.org/10.1016/0168-583X(89)90417-5 |
| Médium: | Elektronický zdroj Kapitola |
| KOHA link: | https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=644847 |
| Shrnutí: | Title screen Spectral distributions of parametric X-rays (PX) have been measured for 900 MeV electrons transmitted through a Si crystal. A displacement of the PX spectral line was observed with the crystal rotation and in scanning PX radiation reflection by a detector. A high degree of linear polarization (P = 0.8) of parametric X-rays was obtained. Режим доступа: по договору с организацией-держателем ресурса |
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| DOI: | 10.1016/0168-583X(89)90417-5 |