APA (7th ed.) Citation

Adishchev Yu. N. Yuri Nikolaevich, Verzilov V. A., Potylitsyn A. P. Alexander Petrovich, Uglov S. R. Sergey Romanovich, & Vorobiev S. A. Sergey Aleksandrovich. (1989). Measurement of spectral and polarization characteristics of parametric X-rays in a Si crystal; Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms; Vol. 44, iss. 2. 1989. https://doi.org/10.1016/0168-583X(89)90417-5

Chicago Style (17th ed.) Citation

Adishchev Yu. N. Yuri Nikolaevich, Verzilov V. A., Potylitsyn A. P. Alexander Petrovich, Uglov S. R. Sergey Romanovich, and Vorobiev S. A. Sergey Aleksandrovich. Measurement of Spectral and Polarization Characteristics of Parametric X-rays in a Si Crystal; Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms; Vol. 44, Iss. 2. 1989, 1989. https://doi.org/10.1016/0168-583X(89)90417-5.

MLA (9th ed.) Citation

Adishchev Yu. N. Yuri Nikolaevich, et al. Measurement of Spectral and Polarization Characteristics of Parametric X-rays in a Si Crystal; Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms; Vol. 44, Iss. 2. 1989, 1989. https://doi.org/10.1016/0168-583X(89)90417-5.