Shot-to-shot stability of intense ion beam generation in a spiral diode with self-magnetic insulation; Instruments and Experimental Techniques; Vol. 58, iss. 5

Bibliografiset tiedot
Parent link:Instruments and Experimental Techniques
Vol. 58, iss. 5.— 2015.— [P. 675-682]
Päätekijä: Pushkarev A. I. Aleksandr Ivanovich
Yhteisötekijä: Национальный исследовательский Томский политехнический университет (ТПУ) Институт физики высоких технологий (ИФВТ) Кафедра техники и электрофизики высоких напряжений (ТЭВН)
Muut tekijät: Isakova Yu. I. Yulia Ivanovna, Khailov I. P. Iliya Pavlovich
Yhteenveto:Title screen
The results of a comparative analysis of the correctness of intense-ion-beam diagnostics, which is based on measurements of the ion-current-density and energy-density amplitudes, are presented. It is shown that when a nanosecond-duration pulsed ion beam is used to modify a surface, the main factor that determines changes in the properties of a treated item is a thermal effect rather than the ion implantation. The analysis of the influence of such factors as the ion-energy variation, the ion-beam composition, accelerated neutrals, the variation in the accelerating voltage, the diagnostics locality, and other factors on the accuracy of controlling the ion-beam impact on a target was performed. It was found that analyzing the stability of the thermal effect of an ion beam on the target on the basis of the amplitude of an ion-current density pulse yields an overestimated standard-deviation value. It was shown that measurements of the energy density provide more accurate and complete information that does not contain systematic errors.
Режим доступа: по договору с организацией-держателем ресурса
Kieli:englanti
Julkaistu: 2015
Sarja:General Experimental Techniques
Aiheet:
Linkit:http://dx.doi.org/10.1134/S0020441215050127
Aineistotyyppi: Elektroninen Kirjan osa
KOHA link:https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=644713

MARC

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200 1 |a Shot-to-shot stability of intense ion beam generation in a spiral diode with self-magnetic insulation  |f A. I. Pushkarev, Yu. I. Isakova, I. P. Khailov 
203 |a Text  |c electronic 
225 1 |a General Experimental Techniques 
300 |a Title screen 
320 |a [References: p. 673-674 (20 tit.)] 
330 |a The results of a comparative analysis of the correctness of intense-ion-beam diagnostics, which is based on measurements of the ion-current-density and energy-density amplitudes, are presented. It is shown that when a nanosecond-duration pulsed ion beam is used to modify a surface, the main factor that determines changes in the properties of a treated item is a thermal effect rather than the ion implantation. The analysis of the influence of such factors as the ion-energy variation, the ion-beam composition, accelerated neutrals, the variation in the accelerating voltage, the diagnostics locality, and other factors on the accuracy of controlling the ion-beam impact on a target was performed. It was found that analyzing the stability of the thermal effect of an ion beam on the target on the basis of the amplitude of an ion-current density pulse yields an overestimated standard-deviation value. It was shown that measurements of the energy density provide more accurate and complete information that does not contain systematic errors. 
333 |a Режим доступа: по договору с организацией-держателем ресурса 
461 |t Instruments and Experimental Techniques 
463 |t Vol. 58, iss. 5  |v [P. 675-682]  |d 2015 
610 1 |a электронный ресурс 
610 1 |a труды учёных ТПУ 
700 1 |a Pushkarev  |b A. I.  |c physicist  |c Professor of Tomsk Polytechnic University, Doctor of physical and mathematical sciences, Senior researcher  |f 1954-  |g Aleksandr Ivanovich  |3 (RuTPU)RU\TPU\pers\32701  |9 16587 
701 1 |a Isakova  |b Yu. I.  |c physicist  |c Associate Professor of Tomsk Polytechnic University, Candidate of Technical Sciences  |f 1988-  |g Yulia Ivanovna  |3 (RuTPU)RU\TPU\pers\32700  |9 16586 
701 1 |a Khailov  |b I. P.  |c physicist  |c Engineer-Researcher of Tomsk Polytechnic University  |f 1990-  |g Iliya Pavlovich  |3 (RuTPU)RU\TPU\pers\32882 
712 0 2 |a Национальный исследовательский Томский политехнический университет (ТПУ)  |b Институт физики высоких технологий (ИФВТ)  |b Кафедра техники и электрофизики высоких напряжений (ТЭВН)  |3 (RuTPU)RU\TPU\col\18692 
801 2 |a RU  |b 63413507  |c 20170210  |g RCR 
856 4 |u http://dx.doi.org/10.1134/S0020441215050127 
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