Significance of electrically induced shear stress in drainage of thin aqueous films

Significance of electrically induced shear stress in drainage of thin aqueous films

Dades bibliogràfiques
Parent link:	Physical Review E: Scientific Journal Vol. 91, iss. 5.— 2015.— [052403 , 17 p.]
Autor principal:	Ketelaar C. Christiaan
Autor corporatiu:	Национальный исследовательский Томский политехнический университет (ТПУ) Энергетический институт (ЭНИН) Кафедра автоматизации теплоэнергетических процессов (АТП)
Altres autors:	Azhaev V. S. Vladimir Sergeevich
Sumari:	Title screen We develop a novel model of drainage of microscale thin aqueous film separating a gas bubble and a solid wall. In contrast to previous studies, the electrostatic effects are accounted for not only in the normal but also in the shear stress balance at the liquid-gas interface. We show that the action of the tangential component of the electric field leads to potentially strong spatially variable shear stress at the deforming charged interface. This previously overlooked effect turns out to be essential for correctly estimating the long-time drainage rates. Comparison of time-dependent fluid interface shapes predicted by our model with the experimental data is discussed. Режим доступа: по договору с организацией-держателем ресурса
Idioma:	anglès
Publicat:	2015
Matèries:	электронный ресурс труды учёных ТПУ электрические напряжения
Accés en línia:	http://dx.doi.org/10.1103/PhysRevE.91.052403
Format:	Electrònic Capítol de llibre
KOHA link:	https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=644648

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