Comparison of the calculated and experimental dataof the extracted electron beam profile
| Parent link: | IOP Conference Series: Materials Science and Engineering Vol. 93: Modern Technique and Technologies (MTT'2015).— 2015.— [012067, 4 p.] |
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| Համատեղ հեղինակ: | |
| Այլ հեղինակներ: | , , , |
| Ամփոփում: | Title screen The current commercial use of electron accelerators grows in research, industry,medical diagnosis and treatment. Due to this fact, the creation of a model describing theelectron beam profile and shape is an actual task. The model of the TPU microtron extractedelectron beam created in the program "Computer Laboratory (PCLab)" is described andcompared with experimental results in this article. The value of the internal electron beamdivergence determination is illustrated. The experimental data of the electron beam profilesat the selected distances from the output window are analysed and compared with thesimulation data. The simulation data of the electron beam profiles are shown. Режим доступа: по договору с организацией-держателем ресурса |
| Հրապարակվել է: |
2015
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| Շարք: | Physical methods in science and engineering |
| Խորագրեր: | |
| Առցանց հասանելիություն: | http://dx.doi.org/10.1088/1757-899X/93/1/012067 http://earchive.tpu.ru/handle/11683/20080 |
| Ձևաչափ: | Էլեկտրոնային Գրքի գլուխ |
| KOHA link: | https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=644565 |
| Ամփոփում: | Title screen The current commercial use of electron accelerators grows in research, industry,medical diagnosis and treatment. Due to this fact, the creation of a model describing theelectron beam profile and shape is an actual task. The model of the TPU microtron extractedelectron beam created in the program "Computer Laboratory (PCLab)" is described andcompared with experimental results in this article. The value of the internal electron beamdivergence determination is illustrated. The experimental data of the electron beam profilesat the selected distances from the output window are analysed and compared with thesimulation data. The simulation data of the electron beam profiles are shown. Режим доступа: по договору с организацией-держателем ресурса |
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| DOI: | 10.1088/1757-899X/93/1/012067 |