Fabrication of customizable wedged multilayer Laue lenses by adding a stress layer
| Parent link: | Thin Solid Films: International Journal on the Science and Technology of Condensed Matter Films.— , 1967- Vol. 571, pt. 2.— 2015.— [P. 321–324] |
|---|---|
| Corporate Author: | |
| Other Authors: | , , , , , , , |
| Summary: | Title screen Diffractive optics for hard X-rays feature superior properties in terms of resolution and efficiency, if volume diffraction effects are exploited all-over the aperture. For multilayer Laue lenses, preferably a wedged geometry is required to obtain this effect. We present an approach utilizing an additional stress layer to realize the necessary geometrical modifications where each lens can be customized to a selected photon energy independently of the given multilayer deposition. The quality of the deposition of the stress layer is evaluated using a laboratory X-ray microscope prior to its application at synchrotron radiation facilities with a special approach to measure the relative layer tilt at high spatial resolution. Режим доступа: по договору с организацией-держателем ресурса |
| Language: | English |
| Published: |
2015
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| Subjects: | |
| Online Access: | http://dx.doi.org/10.1016/j.tsf.2014.02.095 |
| Format: | Electronic Book Chapter |
| KOHA link: | https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=643141 |
MARC
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| 200 | 1 | |a Fabrication of customizable wedged multilayer Laue lenses by adding a stress layer |f S. Niese [et al.] | |
| 203 | |a Text |c electronic | ||
| 300 | |a Title screen | ||
| 320 | |a [References: p. 324 (7 tit.)] | ||
| 330 | |a Diffractive optics for hard X-rays feature superior properties in terms of resolution and efficiency, if volume diffraction effects are exploited all-over the aperture. For multilayer Laue lenses, preferably a wedged geometry is required to obtain this effect. We present an approach utilizing an additional stress layer to realize the necessary geometrical modifications where each lens can be customized to a selected photon energy independently of the given multilayer deposition. The quality of the deposition of the stress layer is evaluated using a laboratory X-ray microscope prior to its application at synchrotron radiation facilities with a special approach to measure the relative layer tilt at high spatial resolution. | ||
| 333 | |a Режим доступа: по договору с организацией-держателем ресурса | ||
| 461 | |t Thin Solid Films |o International Journal on the Science and Technology of Condensed Matter Films |d 1967- | ||
| 463 | |t Vol. 571, pt. 2 |v [P. 321–324] |d 2015 | ||
| 610 | 1 | |a электронный ресурс | |
| 610 | 1 | |a труды учёных ТПУ | |
| 610 | 1 | |a X-ray optics | |
| 610 | 1 | |a diffractive optics | |
| 610 | 1 | |a X-ray microscopy | |
| 610 | 1 | |a multilayers | |
| 610 | 1 | |a stress layer | |
| 610 | 1 | |a sputter deposition | |
| 610 | 1 | |a focused ion beam | |
| 701 | 1 | |a Niese |b S. |g Sven | |
| 701 | 1 | |a Krüger |b P. |g Peter | |
| 701 | 1 | |a Kubec |b A. |g Adam | |
| 701 | 1 | |a Laas |b R. A. |c Physicist |c Assistant of the Department of Tomsk Polytechnic University |f 1991- |g Roman Aleksandrovich |3 (RuTPU)RU\TPU\pers\35139 |9 18414 | |
| 701 | 1 | |a Gawlitza |b P. |g Peter | |
| 701 | 1 | |a Melzer |b K. |g Kathleen | |
| 701 | 1 | |a Braun |b S. |g Stefan | |
| 701 | 1 | |a Zschech |b E. |g Ehrenfried | |
| 712 | 0 | 2 | |a Национальный исследовательский Томский политехнический университет (ТПУ) |b Физико-технический институт (ФТИ) |b Кафедра физико-энергетических установок (№ 21) (ФЭУ) |3 (RuTPU)RU\TPU\col\18730 |
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| 856 | 4 | |u http://dx.doi.org/10.1016/j.tsf.2014.02.095 | |
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