Fabrication of customizable wedged multilayer Laue lenses by adding a stress layer
| Parent link: | Thin Solid Films: International Journal on the Science and Technology of Condensed Matter Films.— , 1967- Vol. 571, pt. 2.— 2015.— [P. 321–324] |
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| Corporate Author: | |
| Other Authors: | , , , , , , , |
| Summary: | Title screen Diffractive optics for hard X-rays feature superior properties in terms of resolution and efficiency, if volume diffraction effects are exploited all-over the aperture. For multilayer Laue lenses, preferably a wedged geometry is required to obtain this effect. We present an approach utilizing an additional stress layer to realize the necessary geometrical modifications where each lens can be customized to a selected photon energy independently of the given multilayer deposition. The quality of the deposition of the stress layer is evaluated using a laboratory X-ray microscope prior to its application at synchrotron radiation facilities with a special approach to measure the relative layer tilt at high spatial resolution. Режим доступа: по договору с организацией-держателем ресурса |
| Language: | English |
| Published: |
2015
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| Subjects: | |
| Online Access: | http://dx.doi.org/10.1016/j.tsf.2014.02.095 |
| Format: | Electronic Book Chapter |
| KOHA link: | https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=643141 |
| Summary: | Title screen Diffractive optics for hard X-rays feature superior properties in terms of resolution and efficiency, if volume diffraction effects are exploited all-over the aperture. For multilayer Laue lenses, preferably a wedged geometry is required to obtain this effect. We present an approach utilizing an additional stress layer to realize the necessary geometrical modifications where each lens can be customized to a selected photon energy independently of the given multilayer deposition. The quality of the deposition of the stress layer is evaluated using a laboratory X-ray microscope prior to its application at synchrotron radiation facilities with a special approach to measure the relative layer tilt at high spatial resolution. Режим доступа: по договору с организацией-держателем ресурса |
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| DOI: | 10.1016/j.tsf.2014.02.095 |