Kuznetsov G. V. Geny Vladimirovich & Kravchenko E. V. Evgeny Vladimirovich. (2015). A new approach to numerical analysis of reliability indices in electronics; European Physical Journal Web of Conferences (EPJ Web of Conferences); Vol. 82: Thermophysical Basis of Energy Technologies. 2015. https://doi.org/10.1051/epjconf/20158201029
Chicago Style (17. basım) AtıfKuznetsov G. V. Geny Vladimirovich ve Kravchenko E. V. Evgeny Vladimirovich. A New Approach to Numerical Analysis of Reliability Indices in Electronics; European Physical Journal Web of Conferences (EPJ Web of Conferences); Vol. 82: Thermophysical Basis of Energy Technologies. 2015, 2015. https://doi.org/10.1051/epjconf/20158201029.
MLA (9th ed.) AtıfKuznetsov G. V. Geny Vladimirovich ve Kravchenko E. V. Evgeny Vladimirovich. A New Approach to Numerical Analysis of Reliability Indices in Electronics; European Physical Journal Web of Conferences (EPJ Web of Conferences); Vol. 82: Thermophysical Basis of Energy Technologies. 2015, 2015. https://doi.org/10.1051/epjconf/20158201029.