About accuracy of the discrimination parameter estimation for the dual high-energy method; IOP Conference Series: Materials Science and Engineering; Vol. 81 : Radiation-Thermal Effects and Processes in Inorganic Materials

Bibliografische gegevens
Parent link:IOP Conference Series: Materials Science and Engineering
Vol. 81 : Radiation-Thermal Effects and Processes in Inorganic Materials.— 2015.— [012082, 13 p.]
Coauteur: Национальный исследовательский Томский политехнический университет (ТПУ) Институт неразрушающего контроля (ИНК) Лаборатория № 40 (Технической томографии и интроскопии) (Лаборатория № 40)
Andere auteurs: Osipov S. P. Sergey Pavlovich, Chakhlov S. V. Sergey Vladimirovich, Osipov O. S. Oleg Sergeevich, Stein A. M. Aleksandr Mikhailovich, Strugovtsev D. V.
Samenvatting:Title screen
A set of the mathematical formulas to estimate the accuracy of discrimination parameters for two implementations of the dual high energy method - by the effective atomic number and by the level lines is given. The hardware parameters which influenced on the accuracy of the discrimination parameters are stated. The recommendations to form the structure of the high energy X-ray radiation impulses are formulated. To prove the applicability of the proposed procedure there were calculated the statistical errors of the discrimination parameters for the cargo inspection system of the Tomsk polytechnic university on base of the portable betatron MIB-9. The comparison of the experimental estimations and the theoretical ones of the discrimination parameter errors was carried out. It proved the practical applicability of the algorithm to estimate the discrimination parameter errors for the dual high energy method.
Режим доступа: по договору с организацией-держателем ресурса
Taal:Engels
Gepubliceerd in: 2015
Onderwerpen:
Online toegang:http://dx.doi.org/10.1088/1757-899X/81/1/012082
http://earchive.tpu.ru/handle/11683/14726
Formaat: Elektronisch Hoofdstuk
KOHA link:https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=643007
Omschrijving
Samenvatting:Title screen
A set of the mathematical formulas to estimate the accuracy of discrimination parameters for two implementations of the dual high energy method - by the effective atomic number and by the level lines is given. The hardware parameters which influenced on the accuracy of the discrimination parameters are stated. The recommendations to form the structure of the high energy X-ray radiation impulses are formulated. To prove the applicability of the proposed procedure there were calculated the statistical errors of the discrimination parameters for the cargo inspection system of the Tomsk polytechnic university on base of the portable betatron MIB-9. The comparison of the experimental estimations and the theoretical ones of the discrimination parameter errors was carried out. It proved the practical applicability of the algorithm to estimate the discrimination parameter errors for the dual high energy method.
Режим доступа: по договору с организацией-держателем ресурса
DOI:10.1088/1757-899X/81/1/012082