Research on the radiation exposure "memory effects" in AlGaAs heterostructures; IOP Conference Series: Materials Science and Engineering; Vol. 81 : Radiation-Thermal Effects and Processes in Inorganic Materials

Research on the radiation exposure "memory effects" in AlGaAs heterostructures; IOP Conference Series: Materials Science and Engineering; Vol. 81 : Radiation-Thermal Effects and Processes in Inorganic Materials

Dettagli Bibliografici
Parent link:	IOP Conference Series: Materials Science and Engineering Vol. 81 : Radiation-Thermal Effects and Processes in Inorganic Materials.— 2015.— [012007, 7 p.]
Autore principale:	Gradoboev A. V. Aleksandr Vasilyevich
Ente Autore:	Национальный исследовательский Томский политехнический университет (ТПУ) Юргинский технологический институт (филиал) (ЮТИ) Кафедра естественного научного образования (ЕНО)
Altri autori:	Sednev V. V. Vyacheslav Vladimirovich
Riassunto:	Title screen Radiation exposure and long running time cause degradation of semiconductors' structures as well as semiconductors based on these structures. Besides, long running time can be the reason of partial radiation defects annealing. The purpose of the research work is to study the "memory effect" that happens during fast neuron radiation in AlGaAs heterostructures. Objects of the research are Infrared Light Emitting Electrodes (IRED) based on doubled AlGaAs heterostructures. During the experimental research LEDs were preliminarily radiated with fast neutrons, and radiation defects were annealed within the condition of current training with high temperatures, then emission power was measured. The research proved the existence of the "memory effect" that results in radiation stability enhancement with subsequent radiation. Possible mechanisms of the "memory effect" occurrence are under review. Режим доступа: по договору с организацией-держателем ресурса
Lingua:	inglese
Pubblicazione:	2015
Soggetti:	электронный ресурс труды учёных ТПУ радиационные воздействия гетероструктуры полупроводники светодиоды эффект памяти
Accesso online:	http://dx.doi.org/10.1088/1757-899X/81/1/012007 http://earchive.tpu.ru/handle/11683/14688
Natura:	Elettronico Capitolo di libro
KOHA link:	https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=642940

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