Change Spectrum Characteristics Modification of Films Deposited by Magnetron Sputtering with the Assistance of Argon Ions Beam

Dades bibliogràfiques
Parent link:IOP Conference Series: Materials Science and Engineering
Vol. 81 : Radiation-Thermal Effects and Processes in Inorganic Materials.— 2015.— [012001, 5 p.]
Autor principal: Umnov S. P. Sergey Pavlovich
Autor corporatiu: Национальный исследовательский Томский политехнический университет
Altres autors: Asainov O. Kh. Oleg Khaydarovich
Sumari:Title screen
Thin aluminum films were prepared using the method of magnetron sputtering with and without argon ion beam assistance. The influence of argon ion beam on the reflectivity in the UV range and the structure of aluminum films was studied. The structure of the films was studied by transmission electron microscopy (TEM), X-ray diffractometry (XRD) and atomic-force microscope (AFM). The study has shown that the films deposed with the assistance of the argon ion beam have more significant microstresses associated with an increase of crystallites microstructure defects as compared to the films deposed without ion assistance. Comparison of the measured reflectivity of aluminum films deposed without and with the assistance of the ion beam has shown that the films characterized by a higher level of microstructure def ects have increased reflectivity in the UV range. The studies suggest that the defects of thin aluminum films crystal structure influence its optical properties.
Режим доступа: по договору с организацией-держателем ресурса
Publicat: 2015
Matèries:
Accés en línia:http://dx.doi.org/10.1088/1757-899X/81/1/012001
http://earchive.tpu.ru/handle/11683/14685
Format: Electrònic Capítol de llibre
KOHA link:https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=642935

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