$X-ray diffraction method for determination of interplanar spacing and temperature distribution in crystals under an external temperature gradient$

X-ray diffraction method for determination of interplanar spacing and temperature distribution in crystals under an external temperature gradient

Détails bibliographiques
Parent link:	Journal of Applied Crystallography.— , 2015 Vol. 48, P. 3.— 2015.— [P. 853-856]
Collectivité auteur:	Национальный исследовательский Томский политехнический университет (ТПУ) Физико-технический институт (ФТИ) Кафедра прикладной физики (№ 12) (ПФ)
Autres auteurs:	Kocharian V. R. Vagan Rashidovich, Gogolev A. S. Aleksey Sergeevich, Movsisyan A. E. Artur Egisheevich, Beybutyan A. H., Khlopuzyan S. G., Aloyan L. Lusine
Résumé:	Title screen An X-ray diffraction method is developed for the determination of the distribution of temperature and interplanar spacing in a single-crystal plate. In particular, the temperature and the interplanar spacing differences in two different parts of a quartz single crystal of X-cut are experimentally determined depending on the value of the temperature gradient applied perpendicularly to the reflecting atomic planes (10\bar 11). The temperature distribution along the direction perpendicular to the reflecting atomic planes (10\bar 11) and the interplanar spacing distribution of atomic planes (10\bar 11) are determined as well. Режим доступа: по договору с организацией-держателем ресурса
Publié:	2015
Sujets:	электронный ресурс труды учёных ТПУ
Accès en ligne:	http://dx.doi.org/10.1107/S1600576715006913
Format:	Électronique Chapitre de livre
KOHA link:	https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=642850

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