$X-ray diffraction method for determination of interplanar spacing and temperature distribution in crystals under an external temperature gradient; Journal of Applied Crystallography; Vol. 48, P. 3$

X-ray diffraction method for determination of interplanar spacing and temperature distribution in crystals under an external temperature gradient

Xehetasun bibliografikoak
Parent link:	Journal of Applied Crystallography.— , 2015 Vol. 48, P. 3.— 2015.— [P. 853-856]
Erakunde egilea:	Национальный исследовательский Томский политехнический университет (ТПУ) Физико-технический институт (ФТИ) Кафедра прикладной физики (№ 12) (ПФ)
Beste egile batzuk:	Kocharian V. R. Vagan Rashidovich, Gogolev A. S. Aleksey Sergeevich, Movsisyan A. E. Artur Egisheevich, Beybutyan A. H., Khlopuzyan S. G., Aloyan L. Lusine
Gaia:	Title screen An X-ray diffraction method is developed for the determination of the distribution of temperature and interplanar spacing in a single-crystal plate. In particular, the temperature and the interplanar spacing differences in two different parts of a quartz single crystal of X-cut are experimentally determined depending on the value of the temperature gradient applied perpendicularly to the reflecting atomic planes (10\bar 11). The temperature distribution along the direction perpendicular to the reflecting atomic planes (10\bar 11) and the interplanar spacing distribution of atomic planes (10\bar 11) are determined as well. Режим доступа: по договору с организацией-держателем ресурса
Hizkuntza:	ingelesa
Argitaratua:	2015
Gaiak:	электронный ресурс труды учёных ТПУ
Sarrera elektronikoa:	http://dx.doi.org/10.1107/S1600576715006913
Formatua:	Baliabide elektronikoa Liburu kapitulua
KOHA link:	https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=642850

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