X-ray diffraction method for determination of interplanar spacing and temperature distribution in crystals under an external temperature gradient
| Parent link: | Journal of Applied Crystallography.— , 2015 Vol. 48, P. 3.— 2015.— [P. 853-856] |
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| Institution som forfatter: | |
| Andre forfattere: | , , , , , |
| Summary: | Title screen An X-ray diffraction method is developed for the determination of the distribution of temperature and interplanar spacing in a single-crystal plate. In particular, the temperature and the interplanar spacing differences in two different parts of a quartz single crystal of X-cut are experimentally determined depending on the value of the temperature gradient applied perpendicularly to the reflecting atomic planes (10\bar 11). The temperature distribution along the direction perpendicular to the reflecting atomic planes (10\bar 11) and the interplanar spacing distribution of atomic planes (10\bar 11) are determined as well. Режим доступа: по договору с организацией-держателем ресурса |
| Sprog: | engelsk |
| Udgivet: |
2015
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| Fag: | |
| Online adgang: | http://dx.doi.org/10.1107/S1600576715006913 |
| Format: | Electronisk Book Chapter |
| KOHA link: | https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=642850 |
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| 200 | 1 | |a X-ray diffraction method for determination of interplanar spacing and temperature distribution in crystals under an external temperature gradient |f V. R. Kocharyan [et al.] | |
| 203 | |a Text |c electronic | ||
| 300 | |a Title screen | ||
| 320 | |a [References: p. 856 (14 tit.)] | ||
| 330 | |a An X-ray diffraction method is developed for the determination of the distribution of temperature and interplanar spacing in a single-crystal plate. In particular, the temperature and the interplanar spacing differences in two different parts of a quartz single crystal of X-cut are experimentally determined depending on the value of the temperature gradient applied perpendicularly to the reflecting atomic planes (10\bar 11). The temperature distribution along the direction perpendicular to the reflecting atomic planes (10\bar 11) and the interplanar spacing distribution of atomic planes (10\bar 11) are determined as well. | ||
| 333 | |a Режим доступа: по договору с организацией-держателем ресурса | ||
| 461 | |t Journal of Applied Crystallography |d 2015 | ||
| 463 | |t Vol. 48, P. 3 |v [P. 853-856] |d 2015 | ||
| 610 | 1 | |a электронный ресурс | |
| 610 | 1 | |a труды учёных ТПУ | |
| 701 | 1 | |a Kocharian |b V. R. |c physicist |c assistant of Tomsk Polytechnic University, candidate of physico-mathematical Sciences |f 1976- |g Vagan Rashidovich |3 (RuTPU)RU\TPU\pers\34228 | |
| 701 | 1 | |a Gogolev |b A. S. |c physicist |c associate professor of Tomsk Polytechnic University, Candidate of physical and mathematical sciences |f 1983- |g Aleksey Sergeevich |3 (RuTPU)RU\TPU\pers\31537 |9 15698 | |
| 701 | 1 | |a Movsisyan |b A. E. |g Artur Egisheevich | |
| 701 | 1 | |a Beybutyan |b A. H. | |
| 701 | 1 | |a Khlopuzyan |b S. G. | |
| 701 | 1 | |a Aloyan |b L. |c physicist |c researcher of Tomsk Polytechnic University, candidate of physico-mathematical Sciences |f 1979- |g Lusine |3 (RuTPU)RU\TPU\pers\39848 | |
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| 856 | 4 | |u http://dx.doi.org/10.1107/S1600576715006913 | |
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