X-ray diffraction method for determination of interplanar spacing and temperature distribution in crystals under an external temperature gradient; Journal of Applied Crystallography; Vol. 48, P. 3
| Источник: | Journal of Applied Crystallography.— , 2015 Vol. 48, P. 3.— 2015.— [P. 853-856] |
|---|---|
| Автор-организация: | |
| Другие авторы: | , , , , , |
| Примечания: | Title screen An X-ray diffraction method is developed for the determination of the distribution of temperature and interplanar spacing in a single-crystal plate. In particular, the temperature and the interplanar spacing differences in two different parts of a quartz single crystal of X-cut are experimentally determined depending on the value of the temperature gradient applied perpendicularly to the reflecting atomic planes (10\bar 11). The temperature distribution along the direction perpendicular to the reflecting atomic planes (10\bar 11) and the interplanar spacing distribution of atomic planes (10\bar 11) are determined as well. Режим доступа: по договору с организацией-держателем ресурса |
| Язык: | английский |
| Опубликовано: |
2015
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| Предметы: | |
| Online-ссылка: | http://dx.doi.org/10.1107/S1600576715006913 |
| Формат: | Электронный ресурс Статья |
| Запись в KOHA: | https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=642850 |
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| 200 | 1 | |a X-ray diffraction method for determination of interplanar spacing and temperature distribution in crystals under an external temperature gradient |f V. R. Kocharyan [et al.] | |
| 203 | |a Text |c electronic | ||
| 300 | |a Title screen | ||
| 320 | |a [References: p. 856 (14 tit.)] | ||
| 330 | |a An X-ray diffraction method is developed for the determination of the distribution of temperature and interplanar spacing in a single-crystal plate. In particular, the temperature and the interplanar spacing differences in two different parts of a quartz single crystal of X-cut are experimentally determined depending on the value of the temperature gradient applied perpendicularly to the reflecting atomic planes (10\bar 11). The temperature distribution along the direction perpendicular to the reflecting atomic planes (10\bar 11) and the interplanar spacing distribution of atomic planes (10\bar 11) are determined as well. | ||
| 333 | |a Режим доступа: по договору с организацией-держателем ресурса | ||
| 461 | |t Journal of Applied Crystallography |d 2015 | ||
| 463 | |t Vol. 48, P. 3 |v [P. 853-856] |d 2015 | ||
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| 701 | 1 | |a Gogolev |b A. S. |c physicist |c associate professor of Tomsk Polytechnic University, Candidate of physical and mathematical sciences |f 1983- |g Aleksey Sergeevich |3 (RuTPU)RU\TPU\pers\31537 |9 15698 | |
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