Double diffraction radiation target interferometry for micro-train beam diagnostics; 5th International Particle Accelerator Conference IPAC’14, 15 – 20 June, 2014, Dresden, Germany

Бібліографічні деталі
Parent link:5th International Particle Accelerator Conference IPAC’14, 15 – 20 June, 2014, Dresden, Germany.— 2014.— [P. 3635-3637]
Співавтор: Национальный исследовательский Томский политехнический университет (ТПУ) Физико-технический институт (ФТИ) Кафедра прикладной физики (№ 12) (ПФ)
Інші автори: Shkitov D. A. Dmitriy Andreevich, Potylitsyn A. P. Alexander Petrovich, Aryshev A. S. Aleksandr Sergeevich, Urakawa J.
Резюме:Title screen
Promising technique to generate short, high-brightnessTHz-frequency coherent radiation pulses is to use amicro-train electron beam. That’s why the creation anddevelopment of a method to diagnose a micro-trainelectron beam becomes essential. Recently our groupstarts to investigate a feasibility of double diffractionradiation (DR) target interferometry for non-invasivemicro-train beam diagnostics at KEK: LUCX facility. Inthis report we present double DR target preparationaccuracy requirements in order to minimize measurementuncertainties and increase interferometer resolution.
Мова:Англійська
Опубліковано: 2014
Серія:Instrumentation, Controls, Feedback & Operational Aspects
Предмети:
Онлайн доступ:http://accelconf.web.cern.ch/AccelConf/IPAC2014/papers/thpme159.pdf
Формат: Електронний ресурс Частина з книги
KOHA link:https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=641540
Опис
Резюме:Title screen
Promising technique to generate short, high-brightnessTHz-frequency coherent radiation pulses is to use amicro-train electron beam. That’s why the creation anddevelopment of a method to diagnose a micro-trainelectron beam becomes essential. Recently our groupstarts to investigate a feasibility of double diffractionradiation (DR) target interferometry for non-invasivemicro-train beam diagnostics at KEK: LUCX facility. Inthis report we present double DR target preparationaccuracy requirements in order to minimize measurementuncertainties and increase interferometer resolution.