Double diffraction radiation target interferometry for micro-train beam diagnostics

Double diffraction radiation target interferometry for micro-train beam diagnostics

Մատենագիտական մանրամասներ
Parent link:5th International Particle Accelerator Conference IPAC’14, 15 – 20 June, 2014, Dresden, Germany.— 2014.— [P. 3635-3637]
Համատեղ հեղինակ: Национальный исследовательский Томский политехнический университет (ТПУ) Физико-технический институт (ФТИ) Кафедра прикладной физики (№ 12) (ПФ)
Այլ հեղինակներ: Shkitov D. A. Dmitriy Andreevich, Potylitsyn A. P. Alexander Petrovich, Aryshev A. S. Aleksandr Sergeevich, Urakawa J.
Ամփոփում:Title screen
Promising technique to generate short, high-brightnessTHz-frequency coherent radiation pulses is to use amicro-train electron beam. That’s why the creation anddevelopment of a method to diagnose a micro-trainelectron beam becomes essential. Recently our groupstarts to investigate a feasibility of double diffractionradiation (DR) target interferometry for non-invasivemicro-train beam diagnostics at KEK: LUCX facility. Inthis report we present double DR target preparationaccuracy requirements in order to minimize measurementuncertainties and increase interferometer resolution.
Լեզու:անգլերեն
Հրապարակվել է: 2014
Շարք:Instrumentation, Controls, Feedback & Operational Aspects
Խորագրեր:
электронный ресурс
труды учёных ТПУ
Առցանց հասանելիություն:http://accelconf.web.cern.ch/AccelConf/IPAC2014/papers/thpme159.pdf
Ձևաչափ: Էլեկտրոնային Գրքի գլուխ
KOHA link:https://koha.lib.tpu.ru/cgi-bin/koha/opac-detail.pl?biblionumber=641540
Նկարագրություն
Ամփոփում:Title screen
Promising technique to generate short, high-brightnessTHz-frequency coherent radiation pulses is to use amicro-train electron beam. That’s why the creation anddevelopment of a method to diagnose a micro-trainelectron beam becomes essential. Recently our groupstarts to investigate a feasibility of double diffractionradiation (DR) target interferometry for non-invasivemicro-train beam diagnostics at KEK: LUCX facility. Inthis report we present double DR target preparationaccuracy requirements in order to minimize measurementuncertainties and increase interferometer resolution.

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